Papers

Peer-reviewed
2015

Transistors fabricated using the single crystals of [8]phenacene

JOURNAL OF MATERIALS CHEMISTRY C
  • Yuma Shimo
  • Takahiro Mikami
  • Hiroto T. Murakami
  • Shino Hamao
  • Hidenori Goto
  • Hideki Okamoto
  • Shin Gohda
  • Kaori Sato
  • Antonio Cassinese
  • Yasuhiko Hayashi
  • Yoshihiro Kubozono
  • Display all

Volume
3
Number
28
First page
7370
Last page
7378
Language
English
Publishing type
Research paper (scientific journal)
DOI
10.1039/c5tc00960j
Publisher
ROYAL SOC CHEMISTRY

Field-effect transistors (FETs) with single crystals of a new phenacene-type molecule, [8]phenacene, were fabricated and characterized. This new molecule consists of a phenacene core of eight benzene rings, with an extended p-conjugated system, which was recently synthesized for use in an FET by our group. The FET characteristics of an [8]phenacene single-crystal FET with SiO2 gate dielectrics show typical p-channel properties with an average field-effect mobility, <mu >, as high as 3(2) cm(2) V-1 s(-1) in two-terminal measurement mode, which is a relatively high value for a p-channel single-crystal FET. The hmi was determined to be 6(2) cm(2) V-1 s(-1) in four-terminal measurement mode. Low-voltage operation was achieved with PbZr0.52Ti0.48O3 (PZT) as the gate dielectric, and an electric-double-layer (EDL) capacitor. The <mu > and average values of absolute threshold voltage, <vertical bar V-th vertical bar >, were 1.6(4) cm(2) V-1 s(-1) and 5(1) V, respectively, for PZT, and 4(2) x 10(-1) cm(2) V-1 s(-1) and 2.38(4) V, respectively, for the EDL capacitor; these values were evaluated in two-terminal measurement mode. The inverter circuit was fabricated using [8]phenacene and N, N'-1H, 1H-perfluorobutyldicyanoperylene-carboxydi-imide single-crystal FETs. This is the first logic gate circuit using phenacene molecules. Furthermore, the relationship between mu and the number of benzene rings was clarified based on this study and the previous studies on phenacene single-crystal FETs.

Link information
DOI
https://doi.org/10.1039/c5tc00960j
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000357805300016&DestApp=WOS_CPL
ID information
  • DOI : 10.1039/c5tc00960j
  • ISSN : 2050-7526
  • eISSN : 2050-7534
  • Web of Science ID : WOS:000357805300016

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