Misc.

Jul, 2002

Two modes of nanoleakage expression in single-step adhesives

JOURNAL OF DENTAL RESEARCH
  • FR Tay
  • ,
  • DH Pashley
  • ,
  • M Yoshiyama

Volume
81
Number
7
First page
472
Last page
476
Language
English
Publishing type
Publisher
INT AMER ASSOC DENTAL RESEARCHI A D R/A A D R

Self-etch adhesives that etch, prime, and bond simultaneously should not exhibit incomplete resin infiltration within hybrid layers. We hypothesized that nanoleakage patterns in these systems are artifacts caused by mineral dissolution in mildly acidic silver nitrate. Resin-dentin interfaces bonded with four single-step. self-etch adhesives were examined for nanoleakage by conventional (pH 4.2) and basic ammoniacal (pH 9.5) silver nitrate and prepared for transmission electron microscopy. All adhesives exhibited a reticular mode of nanoleakage within hybrid layers when conventional silver nitrate was used, With ammoniacal silver nitrate, an additional spotted pattern of nanoleakage was observed within adhesive and hybrid layers. The reticular mode of nanoleakage in self-etch adhesives probably represents sites of incomplete water removal that leads to regional suboptimal polymerization. The spotted pattern identified with the use of ammoniacal silver nitrate probably represents potentially permeable regions in the adhesive and hybrid layers that result from the interaction of the basic diamine silver ions with acidic/hydrophilic resin components.

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https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000176582400008&DestApp=WOS_CPL
ID information
  • ISSN : 0022-0345
  • Web of Science ID : WOS:000176582400008

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