MISC

2002年7月

X-ray scattering microscope with a Wolter mirror

REVIEW OF SCIENTIFIC INSTRUMENTS
  • H Takano
  • ,
  • S Aoki
  • ,
  • M Kumegawa
  • ,
  • N Watanabe
  • ,
  • T Ohhigashi
  • ,
  • T Aota
  • ,
  • K Yamamoto
  • ,
  • H Yokosuka
  • ,
  • R Tanoue
  • ,
  • Y Tsujita
  • ,
  • M Ando

73
7
開始ページ
2629
終了ページ
2633
記述言語
英語
掲載種別
DOI
10.1063/1.1487888
出版者・発行元
AMER INST PHYSICS

Full-field x-ray scattering microscopic images were obtained with a Wolter mirror (x10 magnification). A synchrotron radiation white beam (4-20 keV) from a bending magnet beamline at the Photon Factory was used to obtain x-ray scattering images. The system was available for multi-kilo-electron-volt x-ray range (4-12 keV) with the Wolter mirror. The image was formed only with scattered x rays from the object, which is kind of a dark-field image. Very low absorptive materials could be imaged with this microscope. Sensitivity of the system was evaluated and also the detection limit was estimated. (C) 2002 American Institute of Physics.

Web of Science ® 被引用回数 : 5

リンク情報
DOI
https://doi.org/10.1063/1.1487888
CiNii Articles
http://ci.nii.ac.jp/naid/80015442700
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000176427500017&DestApp=WOS_CPL

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