OKUMURA Tsugunori

J-GLOBAL         Last updated: Sep 12, 2017 at 11:37
OKUMURA Tsugunori
Tokyo Metropolitan Industrial Technology Research Institute
Job title
Doctor (Engineering)(The University of Tokyo)

Research Areas


Academic & Professional Experience

Apr 2016
President, Tokyo Metropolitan Industrial Technology Research Institute
Apr 2011
Mar 2016
Vice President, Tokyo Metropolitan University
Apr 2009
Mar 2012
Prof./Dean, Faculty of Urban Liberal Arts, Tokyo Metropolitan University.
Apr 2006
Mar 2009
Prof./Dean, Graduate School of Science & Engineering, Tokyo Metropolitan University.
Apr 1989
Mar 2005
Professor, Faculty of Engineering, Tokyo Metropolitan University
Apr 1978
Mar 1989
Associate Professor, Faculty of Engineering, Tokyo Metropolitan University
Jul 1981
Jul 1982
Visiting Scientist, IBM Watson Research Center.


May 1973
Mar 1978
Electrronics, Graduate School of Engineering, The University of Tokyo
Apr 1969
Mar 1973
Electronics, School of Engineering, Kyoto University

Committee Memberships

Associate Member of The Science Council of Japan
The Japan Society of Applied Physics  Vice President, Executive Director, Boad Member, Division Chief
The Institute of Eletrical Engineers in Japan  Chair of Technical Committee of Electronic Materials
Technical Committee Member of NEDO

Awards & Honors

Fellow Award (Japan Society of Applied Physics)

Published Papers

Takuma Takimoto, Koji Takeshita, Seiji Nakamura, Tsugunori Okumura
Thin Solid Films   557 212-215   Apr 2014   [Refereed]
Seiji Nakamura, Koichi Hoshino, Yuki Ikadai, Masayuki Suda, and Tsugunori Okumura
Jpn. J. Appl. Phys.   52 088001-088003   Jul 2013   [Refereed]
S. Nakamura, N. Takahashi and T. Okumura
phys. stat. sol. (c)   6 S1053-S1055   Jan 2009   [Refereed]
Shiro Kamohara, Chenming Hu, and Tsugunori Okumura
Jpn. J. Appl. Phys.   47(8) 6208-6213   Aug 2008   [Refereed]
Shiro Kamohara, Tsugunori Okumura
Applied Surface Science   254(19) 6174-6176   Jul 2008   [Refereed]

Books etc

Electronic Properties of Materials
OKUMURA Tsugunori
Corona Pub. Co. Ltd.   Dec 2013   ISBN:ISBN978-4-339-01850-9
Formation of Semiconductor Interfaces
Elsevier   2002   
Defects in Optoelectronic Materials
Gordon & Breach   2001   
Hydrogen-related issues in GaAs Schottky Contacts
Extended abstract of 1999 International Conference on GaAs Manufacturing Technology(MANTECH), Vancouver   1999   
Deep-level transient spectroscopy
Encyclopedia of Electrical and Electronic Engineering, ed. J. G. Webster(Wiley, NY, 1999)   1999   

Conference Activities & Talks

Defects formation in III-Nitride dry process, compared with other conventional III-V
2nd International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials   2010   
Contactless characterization of surface and interface band-bending in silicon-on-insulator (SOI) structures
The 9th International Conference on Defects : Recognition, Imaging and Defects in Semiconductors (DRIP-IX), Italy   2001   
Noncontact Characterization of Thin SOI Materials by the Kelvin-probe Method
The 8th International Conference on the Formation of Semiconductor Interfaces   2001   
Hydrogen-related issues in GaAs Schottky Contacts
1999 International Conference on GaAs Manufacturing Technology (MANTECH), Vancouver   1999   
Scanning internal-Photoemission Microscopy: An Imaging Technique to Reveal Microscopic Inhomogeneity at Metal-Semiconductor Interfaces
The 6th International Conf. Defect Recognition and Image Processing of Semiconductors and Devices, Colorado (DRIP 6) (   1995   


Ultimate characterization technique of SOI wafer for the nano-scale LSI devices
1999 - 2003
Reliability Physics of Semiconductor Devices
1995 - Today
Characterization technique of compound semiconductors for optoelectronic devices
1995 - Today
Electrical characterization of poly-Si thin films
2002 - Today

Research Grants & Projects

Characterization of Crystalline Defects in Semiconductor Materials and Devices
Project Year: 1973   
Formation and Microscopic Characterization of Schottky Contacts
Project Year: 1981   
Process-Induced Defect Formation and Relaiblity Issues in Semiconductor Devices
Project Year: 1993   
Contactless Electrical Characterization of Ultrathin Silicon Layers
Research for the Future Program
Project Year: 1999 - 2003
Characterization of Semiconductor Devices and Related Materials