OKUMURA Tsugunori

J-GLOBAL         Last updated: Sep 12, 2017 at 11:37
 
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Name
OKUMURA Tsugunori
Affiliation
Tokyo Metropolitan Industrial Technology Research Institute
Job title
President
Degree
Doctor (Engineering)(The University of Tokyo)

Research Areas

 
 

Academic & Professional Experience

 
Apr 2016
 - 
Today
President, Tokyo Metropolitan Industrial Technology Research Institute
 
Apr 2011
 - 
Mar 2016
Vice President, Tokyo Metropolitan University
 
Apr 2009
 - 
Mar 2012
Prof./Dean, Faculty of Urban Liberal Arts, Tokyo Metropolitan University.
 
Apr 2006
 - 
Mar 2009
Prof./Dean, Graduate School of Science & Engineering, Tokyo Metropolitan University.
 
Apr 1989
 - 
Mar 2005
Professor, Faculty of Engineering, Tokyo Metropolitan University
 
Apr 1978
 - 
Mar 1989
Associate Professor, Faculty of Engineering, Tokyo Metropolitan University
 
Jul 1981
 - 
Jul 1982
Visiting Scientist, IBM Watson Research Center.
 

Education

 
May 1973
 - 
Mar 1978
Electrronics, Graduate School of Engineering, The University of Tokyo
 
Apr 1969
 - 
Mar 1973
Electronics, School of Engineering, Kyoto University
 

Committee Memberships

 
2006
 - 
Today
Associate Member of The Science Council of Japan
 
2008
 - 
2010
The Japan Society of Applied Physics  Vice President, Executive Director, Boad Member, Division Chief
 
2003
 - 
2006
The Institute of Eletrical Engineers in Japan  Chair of Technical Committee of Electronic Materials
 
2002
 - 
2004
Technical Committee Member of NEDO
 

Awards & Honors

 
2007
Fellow Award (Japan Society of Applied Physics)
 

Published Papers

 
Takuma Takimoto, Koji Takeshita, Seiji Nakamura, Tsugunori Okumura
Thin Solid Films   557 212-215   Apr 2014   [Refereed]
Seiji Nakamura, Koichi Hoshino, Yuki Ikadai, Masayuki Suda, and Tsugunori Okumura
Jpn. J. Appl. Phys.   52 088001-088003   Jul 2013   [Refereed]
S. Nakamura, N. Takahashi and T. Okumura
phys. stat. sol. (c)   6 S1053-S1055   Jan 2009   [Refereed]
Shiro Kamohara, Chenming Hu, and Tsugunori Okumura
Jpn. J. Appl. Phys.   47(8) 6208-6213   Aug 2008   [Refereed]
Shiro Kamohara, Tsugunori Okumura
Applied Surface Science   254(19) 6174-6176   Jul 2008   [Refereed]

Books etc

 
Electronic Properties of Materials
OKUMURA Tsugunori
Corona Pub. Co. Ltd.   Dec 2013   ISBN:ISBN978-4-339-01850-9
Formation of Semiconductor Interfaces
Elsevier   2002   
Defects in Optoelectronic Materials
Gordon & Breach   2001   
Hydrogen-related issues in GaAs Schottky Contacts
Extended abstract of 1999 International Conference on GaAs Manufacturing Technology(MANTECH), Vancouver   1999   
Deep-level transient spectroscopy
Encyclopedia of Electrical and Electronic Engineering, ed. J. G. Webster(Wiley, NY, 1999)   1999   

Conference Activities & Talks

 
Defects formation in III-Nitride dry process, compared with other conventional III-V
2nd International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials   2010   
Contactless characterization of surface and interface band-bending in silicon-on-insulator (SOI) structures
The 9th International Conference on Defects : Recognition, Imaging and Defects in Semiconductors (DRIP-IX), Italy   2001   
Noncontact Characterization of Thin SOI Materials by the Kelvin-probe Method
The 8th International Conference on the Formation of Semiconductor Interfaces   2001   
Hydrogen-related issues in GaAs Schottky Contacts
1999 International Conference on GaAs Manufacturing Technology (MANTECH), Vancouver   1999   
Scanning internal-Photoemission Microscopy: An Imaging Technique to Reveal Microscopic Inhomogeneity at Metal-Semiconductor Interfaces
The 6th International Conf. Defect Recognition and Image Processing of Semiconductors and Devices, Colorado (DRIP 6) (   1995   

Works

 
Ultimate characterization technique of SOI wafer for the nano-scale LSI devices
1999 - 2003
Reliability Physics of Semiconductor Devices
1995 - Today
Characterization technique of compound semiconductors for optoelectronic devices
1995 - Today
Electrical characterization of poly-Si thin films
2002 - Today

Research Grants & Projects

 
Characterization of Crystalline Defects in Semiconductor Materials and Devices
Project Year: 1973   
Formation and Microscopic Characterization of Schottky Contacts
Project Year: 1981   
Process-Induced Defect Formation and Relaiblity Issues in Semiconductor Devices
Project Year: 1993   
Contactless Electrical Characterization of Ultrathin Silicon Layers
Research for the Future Program
Project Year: 1999 - 2003
Characterization of Semiconductor Devices and Related Materials