宍戸 哲夫

Determination of Structural Parameters of Bi by the Critical Voltage Method 

Acta Crystallographica(A) 34(S4) 1978年  

Determination of Structure Factors of Ge by the Critical-Voltage and Convergent-Beam Diffraction Method 

Physica status solidi (a) 38(2) 453-461 1976年  

Relation between the 111 and 222 Structure Factors of Si Determined by Critical Voltage Method 

Japanese Journal of Applied Physics 14(1) 1975年