論文

査読有り
2017年1月

Evaluation of Spin-Coated Alumina Passivation Layer for Point-Contacted Rear Electrode Passivation of Silicon Solar Cells

IEICE TRANSACTIONS ON ELECTRONICS
  • Ryosuke Watanabe
  • ,
  • Tsubasa Koyama
  • ,
  • Yoji Saito

E100C
1
開始ページ
101
終了ページ
107
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1587/transele.E100.C.101
出版者・発行元
IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG

We fabricated silicon solar cells with spin-coated sol-gel alumina passivation layers on the rear side. Spin-coated alumina passivation films have moderate passivation quality and are inferior to atomic layer deposited passivation films. However, low-cost and low temperature process of the sol-gel deposition is still beneficial for the cells using commercially available Cz silicon wafers. Thus, we consider an applicability of the spin-coated alumina passivation layer for rear side passivation. Dependence of cell efficiency on contact spacing and contact diameter of a rear electrode was investigated by both experiments and numerical calculation. The experimental results indicated that conversion efficiency of the cell is enhanced from 9.1% to 11.1% by optimizing an aperture ratio and contact spacing of the rear passivation layers. Numerical calculation indicated that small contact diameter with low aperture ratio of a rear passivation layer is preferable to achieve good cell performance in our experimental condition. We confirmed the effectivity of the spin-coated alumina passivation films for rear surface passivation of the low-cost silicon solar cells.

リンク情報
DOI
https://doi.org/10.1587/transele.E100.C.101
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000393061300015&DestApp=WOS_CPL
ID情報
  • DOI : 10.1587/transele.E100.C.101
  • ISSN : 1745-1353
  • Web of Science ID : WOS:000393061300015

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