The movement of atom images of a Si crystal lattice under 800 kV electron beam irradiation has been recorded with the 1 MeV atomic resolution electron microscope at U.C. Berkeley equipped with a TV image viewing and video recording system. The small, rapid movements and contrast changes during 1/30 s have been revealed by taking the difference between two successive images which are recorded in each frame of the TV tape and processed. The difference between successive images has been displayed in real and prolonged time.