林 照峯

Test Data Sequence Generation Method for Reduced Scan Shift without Scan Chain Flip-Flop Reordering（共著） 

Proc. of IEEE 6th Workshop on RTL and High Level Testing (WRTLT'05) 73-78 2005年  

Parallel Core Testing with Multiple Scan Chains by Test Vector Overlapping （共著） 

Proc. of 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test (VLSI-TSA-DAT) 205-208 2005年  

Test Modification and Compression Technique for Reducing Total Test Volume with Dictionary Data 

Proc. of 6th International Conference on ASIC (ASICON 2005) 639-644 2005年  

On Test Data Compression Using Selective Don't-Care Identification 

Journal of Computer Science and Technology 20(2) 126-132 2005年  

Test Data Sequence Generation Method for Reduced Scan Shift without Scan Chain Flip-Flop Reordering 

Proc. of IEEE 6th Workshop on RTL and High Level Testing (WRTLT'05) 73-78 2005年  

Parallel Core Testing with Multiple Scan Chains by Test Vector Overlapping 

Proc. of 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test (VLSI-TSA-DAT) 205-208 2005年  

Test Modification and Compression Technique for Reducing Total Test Volume with Dictionary Data 

Proc. of 6th International Conference on ASIC (ASICON 2005) 639-644 2005年  

On Test Data Compression Using Selective Don't-Care Identification 

Journal of Computer Science and Technology 20(2) 126-132 2005年  

A Study on the Simple Penalty Term to the Error Function from the Viewpoint of Fault Tolerant Training （共著） 

Proc. of 2004 International Joint Conference on Neural Networks (IJCNN2004) 1045-1050 2004年  

A CAI System for Increasing Learners' Confidence in Answers （共著） 

Proc. of International Conference on Computers in Education 2004 (ICCE2004) CD-ROM 2004年  

Test Vector Overlapping for Test Cost Reduction in Parallel Testing of Cores with Multiple Scan Chains （共著） 

Proc. of IEEE 5th Workshop on RTL and High Level Testing (WRTLT'04) 117-122 2004年  

On Generating Test Data with High Compressibility （共著） 

Proc. of IEEE 5th Workshop on RTL and High Level Testing (WRTLT'04) 59-64 2004年  

Test Data Compression Technique Using Selective Don't-Care Identification 

Proceedings of Asia and South Pacific Design Automation Conference 2004 (ASP-DAC 2004) pp.230-233 2004年  

システムオンチップLSIの効率的なコアテスティングのためのコア間ベクトルオーバーラッピング法の提案（共著） 

子情報通信学会論文誌D-I J87-D-I(6) 702-711 2004年  

A CAI System for Increasing Learners' Confidence in Answers 

Proc. of International Conference on Computers in Education 2004 (ICCE2004) CD-ROM 2004年  

A Study on the Simple Penalty Term to the Error Function from the Viewpoint of Fault Tolerant Training 

Proc. of 2004 International Joint Conference on Neural Networks (IJCNN2004) 1045-1050 2004年  

Test Vector Overlapping for Test Cost Reduction in Parallel Testing of Cores with Multiple Scan Chains 

Proc. of IEEE 5th Workshop on RTL and High Level Testing (WRTLT'04) 117-122 2004年  

On Generating Test Data with High Compressibility 

Proc. of IEEE 5th Workshop on RTL and High Level Testing (WRTLT'04) 59-64 2004年