SHIMURA Takayoshi

J-GLOBAL         Last updated: Jul 18, 2019 at 02:41
 
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Name
SHIMURA Takayoshi
Affiliation
Osaka University
Section
Graduate School of Engineering Division of Science and Biotechnology
Job title
Associate Professor
Degree
Ph.D(Eng.)(Nagoya University)
Research funding number
90252600

Research Areas

 
 

Academic & Professional Experience

 
2007
   
 
- Osaka University, Associate Professor
 

Published Papers

 
Moges Kidist, Sometani Mitsuru, Hosoi Takuji, Shimura Takayoshi, Harada Shinsuke, Watanabe Heiji
APPLIED PHYSICS EXPRESS   11(10)    Oct 2018   [Refereed]
Hosoi Takuji, Katsu Yoshihito, Moges Kidist, Nagai Daisuke, Sometani Mitsuru, Tsuji Hidenori, Shimura Takayoshi, Watanabe Heiji
APPLIED PHYSICS EXPRESS   11(9)    Sep 2018   [Refereed]
Hosono Ryo, Kawabata Tomoki, Hayashida Kiyoshi, Kudo Togo, Ozaki Kyosuke, Teranishi Nobukazu, Hatsui Takaki, Hosoi Takuji, Watanabe Heiji, Shimura Takayoshi
OPTICS EXPRESS   26(16) 21044-21053   Aug 2018   [Refereed]
Fujita Eigo, Sometani Mitsuru, Hatakeyama Tetsuo, Harada Shinsuke, Yano Hiroshi, Hosoi Takuji, Shimura Takayoshi, Watanabe Heiji
AIP ADVANCES   8(8)    Aug 2018   [Refereed]
Nozaki Mikito, Watanabe Kenta, Yamada Takahiro, Shih Hong-An, Nakazawa Satoshi, Anda Yoshiharu, Ueda Tetsuzo, Yoshigoe Akitaka, Hosoi Takuji, Shimura Takayoshi, Watanabe Heiji
JAPANESE JOURNAL OF APPLIED PHYSICS   57(6)    Jun 2018   [Refereed]

Misc

 
A Structural study of the Thermally oxidized Si(001)water by X-ray CTR scattering(共著)
Surface Science   258,235/,    1991
Observation and Analysis of Growth Surface of Crystals by X-ray Scattering(共著)
Proceeding of the second R. O. C-Japan Joint Seminar on Crystallography   29    1992

Books etc

 
characterization of the Surface of Ice Crystal by X-Ray CTR Scattering(共著)
Physics and Chemistry of Ice   1992   
X-ray Scattering Study of the Thermally Oxidized layer on a Si(001)Water(共著)
Advanced Science and Technology of Silicon Materials   1991   
X-RAY DIFFRACTION EVIDENCE FOR CRYSTALLINE SiO2 IN THERMAL OXIDE LAYERS ON Si SUBSTRATES(共著)
The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 3   1996   
Structure of thermal Oxide on(111)and(011)Si Wafers(共著)
Advanced Science and Technology of Silicon Materials   1996   
Thermally Oxidized Layers on Si-wafers-Surface X-ray Scattering and Field Ion Microscopy-(共著)
Advances in the Understanding of Crystal Gronth Mechanisms   1997   

Works

 
Ultimate Characterization Technique of Silicon Crystal for the Nano-meter LSI Devices
1999
Characterization of Oxidized Si Nano-structure by X-ray Dittraction
1999

Research Grants & Projects

 
Demonstration of high sensitivity and high resolution X-ray imaging with structured X-ray light source
科学研究費補助金、挑戦的研究(萌芽)
Project Year: 2018 - 2019    Investigator(s): 志村 考功 大阪大学
Fabrication of tensile-strained single-crystalline GeSn wires on an insulator by lateral liquid-phase epitaxy towards electronic and opto-electronic device applications
科学研究費補助金、基盤研究(B)
Project Year: 2015 - 2017    Investigator(s): 志村 考功 大阪大学
Development of Super-resolution Technique in Transmission X-ray Imaging using Embedded X-ray Targets
科学研究費補助金、挑戦的萌芽研究
Project Year: 2015 - 2016    Investigator(s): 志村 考功 大阪大学
Improvement of SiO2/SiC interface properties with beam induced interface reactions and subsequent defect passivation
科学研究費補助金、挑戦的萌芽研究
Project Year: 2015 - 2016    Investigator(s): 渡部 平司 大阪大学
Improvement of SiO2/SiC interface quality by beam induced interface reactions
科学研究費補助金、挑戦的萌芽研究
Project Year: 2013 - 2014    Investigator(s): 渡部 平司 大阪大学
Fabrication of vertical strained-Ge MOSFETs by channel-last process and the electrical characterization
科学研究費補助金、基盤研究(B)
Project Year: 2012 - 2014    Investigator(s): 志村 考功 大阪大学
Development of SiC-based plasmonic transistors with Schottky source/drain
科学研究費補助金、若手研究(A)
Project Year: 2012 - 2014    Investigator(s): 細井 卓治 大阪大学
Fabrication and electrical characterization of GOI structures by rapid melt growth
科学研究費補助金、基盤研究(B)
Project Year: 2009 - 2011    Investigator(s): 志村 考功 大阪大学
Development of light emitting devices in 1. 5μm range using germanium epitaxial layers on silicon
科学研究費補助金、基盤研究(B)
Project Year: 2009 - 2011    Investigator(s): 石川 靖彦 東京大学
Measurements of the strain in strained Si wafers by X-ray diffraction methods
科学研究費補助金、基盤研究(C)
Project Year: 2008 - 2010    Investigator(s): 梅野 正隆 福井工業大学
Formation of Buried Oxide Layer in Epitaxial Silicon Wafers
科学研究費補助金、基盤研究(C)
Project Year: 2005 - 2006    Investigator(s): 梅野 正隆 福井工業大学
Fabrication of Large-Grained Polycrystalline Si Thin Films by Controlling Nucleation Sites on Glass Substrates
科学研究費補助金、基盤研究(B)
Project Year: 2004 - 2006    Investigator(s): 安武 潔 大阪大学
X-ray Diffraction Study of the Formation Process of SiO_2/Si Interfaces
科学研究費補助金、基盤研究(B)
Project Year: 1999 - 2001    Investigator(s): 梅野 正隆 大阪大学
Development of the quantitative characterization method for microstructures on semiconductor surfaces by using X-ray diffraction
科学研究費補助金、基盤研究(B)
Project Year: 1997 - 1998    Investigator(s): 梅野 正隆 大阪大学
Development of room-temperature oxidation method of Si due to pulsed hyperthermal atomic oxygen beam
科学研究費補助金、基盤研究(B)
Project Year: 1997 - 1998    Investigator(s): 梅野 正隆 大阪大学
Development of the Angular Resolved Reflection High Energy Electron Diffraction and the Electron Impact Mass Spectroscopy for the Studies of Three Dimensional Structure of Surfaces
科学研究費補助金、基盤研究(B)
Project Year: 1997 - 1998    Investigator(s): 大前 伸夫 神戸大学
Synergistic effect on spacetribology in the low earch orbit
科学研究費補助金、基盤研究(B)
Project Year: 1996 - 1997    Investigator(s): 大前 伸夫 大阪大学
Control of electric charge at the interface in the RTO and low temperature oxidation of SOI
科学研究費補助金、基盤研究(B)
Project Year: 1995 - 1996    Investigator(s): 梅野 正隆 大阪大学
Development of quantitative characterization method of microstructures by X-ray scattering
科学研究費補助金、基盤研究(A)
Project Year: 1995 - 1996    Investigator(s): 梅野 正隆 大阪大学
Characterization of Semiconductor Materials by Synchrotron Radiation X-ray.
Grant-in-Aid for Scientific Research
X-ray Diffraction Study of Crystal Surfaces Interfaces and thin films
Grant-in-Aid for Scientific Research