
Hiroyuki Sakaue
(坂上 弘之)
Modified on: 2020/10/20
Profile Information
- Affiliation
- Hiroshima University
- Researcher number
- 50221263
- J-GLOBAL ID
- 200901013184214191
- researchmap Member ID
- 1000201198
Research History
2Education
3-
Apr, 1987 - Mar, 1989
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Apr, 1983 - Mar, 1987
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Apr, 1983 - Mar, 1987
Papers
137-
15th International Conf. on the Formation of Semiconductor Interfaces, Nov 15, 2015 Peer-reviewed
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Colloids and Materials 2011, -(-) P3.95, May 1, 2011 Peer-reviewed
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Colloids and Materials 2011, -(-) P3.95, May 1, 2011
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Abs. 9th International Conference on Nano-Molecular Electronics, 148, Dec 1, 2010
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Abs. 9th International Conference on Nano-Molecular Electronics, 83, Dec 1, 2010
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Abs. 9th International Conference on Nano-Molecular Electronics, 148, Dec 1, 2010
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Abs. 9th International Conference on Nano-Molecular Electronics, 83, Dec 1, 2010
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Abs. 5th International Meeting on Molecular Electronics, 326, Dec 1, 2010
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The 15th International Conf. on Solid Films and Surfaces (ICSFS-15, Beijing), -, Oct 1, 2010
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炭素, 280-289, Oct 1, 2008 Peer-reviewed
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2008 International Conference on Carbon (CARBON'08), Jul 1, 2008
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X-ray Photoelectron Analysis of Diamondlike Carbon (DLC) Films with Different Electric ResistivitiesThe 9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-9), Nov 11, 2007
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Appl. Surf. Sci., 254 2666-2670, Nov 1, 2007 Peer-reviewed
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JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 46(2) 795-798, Feb, 2007 Peer-reviewed
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e-J. Surf. Sci. Nanotech., 5 1-6, Jan 1, 2007 Peer-reviewed
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Abstracts of 13th International Conf. on Solid Films and Surfaces, 47 (PI-02), Nov 1, 2006
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Abstracts of 13th International Conf. on Solid Films and Surfaces, 240 (PIII-55), Nov 1, 2006
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Abstracts of 8th Asia-Pacific Conference on Plasma Science and Technology, 197, Jul 1, 2006
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Electrochem. Solid-State Letters, 9(4) J13-J16, Apr 1, 2006 Peer-reviewed
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ELECTROCHEMICAL AND SOLID STATE LETTERS, 9(4) J13-J16, 2006 Peer-reviewed
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International Symp. on Surface Science and Nanotechnology, 536, Nov 1, 2005
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8th International Conf. on Atomically Controlled Surfaces, Interfaces and Nanostructures, 114, Jun 1, 2005
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JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 152(10) C684-C687, 2005 Peer-reviewed
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J. Electrochem. Soc., 151(12) C781-C785, Dec 1, 2004 Peer-reviewed
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Jpn. J. Appl. Phys., 43(10) 7000-7001, Oct 1, 2004 Peer-reviewed
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2004 International Conf. on Solid State Devices and Materials, 114-115, Aug 1, 2004
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Appl. Surf. Sci., 234 439-444, Jun 1, 2004 Peer-reviewed
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Electrochem. Solid-State Letters, 7 C78-C80, Jun 1, 2004 Peer-reviewed
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J. Magnetics and Magnetic Materials, 272-276 1598-1599, Jun 1, 2004 Peer-reviewed
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文部科学省 ナノテクノロジー総合支援プロジェクト Spring-8研究成果報告書, 3 42-44, Jun 1, 2004
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Electrochem. Solid-State Letters, 7(3) E15-E17, Mar 1, 2004 Peer-reviewed
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Mat. Res. Soc. Symp. Proc., ULSI-XIX 567, Mar 1, 2004 Peer-reviewed
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JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 151(12) C781-C785, 2004 Peer-reviewed
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ELECTROCHEMICAL AND SOLID STATE LETTERS, 7(6) C78-C80, 2004 Peer-reviewed
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ELECTROCHEMICAL AND SOLID STATE LETTERS, 7(3) E15-E17, 2004 Peer-reviewed
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Abstracts of 7th Int. Conf. on Atomically Controlled Surfaces Interfaces and Nanostructures (ACSIN-7), 228, Nov 1, 2003
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Jpn. J. Appl. Phys., 42(10B) L1223-L1225, Oct 1, 2003 Peer-reviewed
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Proc. of Int. Conf. On Solid State Devices and Materials 2003, 456-457, Sep 1, 2003
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Abstracts of 9th Int. Conf. on Formation of Semiconductor Interfaces (ICFSI-9), 46, Sep 1, 2003
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Appl. Phys. Lett., 83(11) 2226-2228, Sep 1, 2003 Peer-reviewed
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Jpn. J. Appl. Phys., 42(8) 5038-5039, Aug 1, 2003 Peer-reviewed
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J. Appl. Phys., 94(7) 4697-4701, Jul 1, 2003 Peer-reviewed
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Mat. Res. Soc. Symp. Proc., ULSI-XVIII 279-284, Apr 1, 2003 Peer-reviewed
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Jpn. J. Appl. Phys., 42(4B) 1843-1846, Apr 1, 2003 Peer-reviewed
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Electrochem. Solid-State Letters, 6(3) C38-C41, Mar 1, 2003 Peer-reviewed
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Digest of Papers - Microprocesses and Nanotechnology 2003 - 2003 International Microprocesses and Nanotechnology Conference, MNC 2003, 62-63, 2003
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2003 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, 147-150, 2003
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Jpn. J. Appl. Phys., 42(1) 157-161, Jan 1, 2003 Peer-reviewed
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The 19th VLSI Multilevel Interconnect Conference, 147-155, Nov 1, 2002
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Proc. of the 2002 Internaional Interconnect Conference, 176-178, May 1, 2002
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Mat. Res. Soc. Symp. Proc., 705 133-138, Apr 1, 2002 Peer-reviewed
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Mat. Res. Soc. Symp. Proc., 704 47-52, Apr 1, 2002 Peer-reviewed
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Mat. Res. Soc. Symp. Proc., ULSI-XVII 313-318, Apr 1, 2002 Peer-reviewed
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Mat. Res. Soc. Symp. Proc., ULSI-XVII 185-190, Apr 1, 2002 Peer-reviewed
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American Institute of Physics Proceedings, 612 94-104, Apr 1, 2002 Peer-reviewed
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Jpn. J. Appl. Phys., 41(3B) L340-L343, Mar 1, 2002 Peer-reviewed
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Jpn. J. Appl. Phys., 40(11) 6198-6201., Nov 1, 2001 Peer-reviewed
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Mat. Res. Soc. Symp. Proc., ULSI-XVI 229-234, Nov 1, 2001 Peer-reviewed
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Abstracts of Advanced Metallization Conf.(AMC2001), 196-197, Oct 1, 2001
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Abstracts of Advanced Metallization Conf. Asian Session (ADMATA2001), 196-197, Oct 1, 2001
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Mat. Res. Soc. Symp. Proc., ULSI-XVI 647-652, Oct 1, 2001 Peer-reviewed
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Jpn. J. Appl. Phys., 40(8) 4829-4836, Aug 1, 2001 Peer-reviewed
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J. Vac. Sci. Technol. B, 19(6) 2045-2049, Jun 1, 2001 Peer-reviewed
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J. Vac. Sci. Technol. B, 19(5) 1901-1904, May 1, 2001 Peer-reviewed
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Jpn. J. Appl. Phys., 40(5B) L521-L523, May 1, 2001 Peer-reviewed
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Solid State Phenomena, 76-77 105-110, Apr 1, 2001 Peer-reviewed
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ULTRA CLEAN PROCESSING OF SILICON SURFACES 2000, 76-77 105-110, 2001 Peer-reviewed
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APPLIED PHYSICS LETTERS, 78(3) 309-311, Jan, 2001 Peer-reviewed
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J. Vac. Sci. Technol. B, 19(1) 115-120, Jan 1, 2001 Peer-reviewed
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Jpn. J. Appl. Phys., 40(1) 346-349, Jan 1, 2001 Peer-reviewed
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Abstracts of Advanced Metallization Conf. Asian Session(ADMATA2000), 175-176, Oct 1, 2000
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Abstracts of Advanced Metallization Conf. US Session(AMC2000), 85-86, Oct 1, 2000
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J. Vac. Sci. Technol. B, 18(6) 2653-2657, Jun 1, 2000 Peer-reviewed
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Jpn. J. Appl. Phys., 38(12A) L1488-L1490, Dec 1, 1999 Peer-reviewed
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Proc.of 9th International Conference on Production Engineering, 871-876, Sep 1, 1999
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SOLID-STATE ELECTRONICS, 43(6) 1143-1146, Jun, 1999 Peer-reviewed
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J. Vac. Sci. Technol. B, 17(6) 2553-2558, Jun 1, 1999 Peer-reviewed
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Mat. Res. Soc. Symp. Proc., 563 145-150, Apr 1, 1999 Peer-reviewed
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Jpn. J. Appl. Phys., 38(4B) L473-L476, Apr 1, 1999 Peer-reviewed
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Jpn. J. Appl. Phys., 37(12B) 7198-7201, Dec 1, 1998 Peer-reviewed
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1998 International Conf.on Solid State Devices and Materials, 434-435, Sep 1, 1998
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Jpn. J. Appl. Phys., 36(12B) 7791-7795, Dec 1, 1997 Peer-reviewed
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JRCAT International Workshop on Science and Technology of Hydrogen-Terminated Silicon Surfaces, 11-12, Nov 1, 1997
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4th International Symp. on Atomically Controlled Surfaces and Interfaces, 345, Oct 1, 1997
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Jpn. J. Appl. Phys., 36(4B) 2477-2481, Apr 1, 1997 Peer-reviewed
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Jpn. J. Appl. Phys., 36(3B) 1420-1423, Mar 1, 1997 Peer-reviewed
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Proc. of Symp. on Dry Process, 141-146, Nov 1, 1996
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1996 International Conf. on Solid State Devices and Materials, 392-394, Aug 1, 1996
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Jpn. J. Appl. Phys., 35(2B) 1045-1048, Feb 1, 1996 Peer-reviewed
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Jpn. J. Appl. Phys., 35(2B) 1010-1013, Feb 1, 1996 Peer-reviewed
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SEMICONDUCTOR CHARACTERIZATION, 599-604, 1996 Peer-reviewed
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1995 International Conf. on Solid State Devices and Materials, 926-928, Aug 1, 1995
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The 8th Intern. MicroProcess Conf., 172-173, Jul 1, 1995
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International Workshop: Semiconductor Characterization, 1-5, Apr 1, 1995 Peer-reviewed
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Mat. Res. Soc. Symp. Proc., 354 641-646., Apr 1, 1995 Peer-reviewed
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Proc. Intern. Workshop of Semicon. Character.(Gaithersburg= USA), 599-604, Apr 1, 1995 Peer-reviewed
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講談社, 482-492, Apr 1, 1995
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Jpn. J. Appl. Phys., 34(2B) 1246-1248, Feb 1, 1995 Peer-reviewed
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Jpn. J. Appl. Phys., 34(2B) 1030-1036, Feb 1, 1995 Peer-reviewed
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Japanese Journal of Applied Physics, 34(2S) 1246-1248, 1995 Peer-reviewed