MISC

査読有り
2015年3月1日

Micro-assembly of electrostatically driven scanning force microscopy probe using clip mechanism

IEEJ Transactions on Sensors and Micromachines
  • Yusuke Kawai
  • ,
  • Chuan Yu Shao
  • ,
  • Kyosuke Kotani
  • ,
  • Takahito Ono

135
3
開始ページ
98
終了ページ
102
DOI
10.1541/ieejsmas.135.98

© 2015 The Institute of Electrical Engineers of Japan. A micro-assembly technique for microstructures using a silicon clip mechanism is developed for a time-of-flight scanning force microscope (TOF-SFM) probe with an electrostatically driven actuator. Microsprings formed by deep reactive-ion etching are used for the clip micromechanism. Cantilever-shaped microelements for the TOF-SFM are handled by a manipulator, and the microgap between the microspring and opposite wall is expanded by pulling the microspring using a microneedle. Then, the microelement is inserted into the micromechanism, and is clipped by releasing the microspring. After assembly, all microelements are fixed with a conductive glue. Electrostatic actuation of the cantilevered microelement is demonstrated. This technique is advantageous in the fabrication of complex three-dimensional microstructures.

リンク情報
DOI
https://doi.org/10.1541/ieejsmas.135.98
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84923940986&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=84923940986&origin=inward
ID情報
  • DOI : 10.1541/ieejsmas.135.98
  • ISSN : 1341-8939
  • eISSN : 1347-5525
  • SCOPUS ID : 84923940986

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