MISC

査読有り
2010年

S-parameter Analysis of GaN Schottky Diodes for Microwave Power Rectification

2010 IEEE COMPOUND SEMICONDUCTOR INTEGRATED CIRCUIT SYMPOSIUM (CSICS)
  • Jin-Ping Ao
  • ,
  • Kensuke Takahashi
  • ,
  • Naoki Shinohara
  • ,
  • Naoki Niwa
  • ,
  • Teruo Fujiwara
  • ,
  • Yasuo Ohno

記述言語
英語
掲載種別
研究発表ペーパー・要旨(国際会議)
DOI
10.1109/CSICS.2010.5619657
出版者・発行元
IEEE

A gallium nitride (GaN) Schottky diode on semi-insulating SiC has been developed for microwave power rectification. A 2 mu m x 100 mu m finger type diode shows ON resistance of 8.2 Omega and depletion capacitance of 0.36 pF at 0 V with breakdown voltage of 90 V. S-parameter analysis separated the ON resistance into the intrinsic part and the access region part, which will benefit device optimization. With a 10-finger diode, RF/DC conversion efficiency of 74.4% is obtained at input power of 5 W and frequency of 2.45 GHz.

リンク情報
DOI
https://doi.org/10.1109/CSICS.2010.5619657
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000286942400054&DestApp=WOS_CPL
ID情報
  • DOI : 10.1109/CSICS.2010.5619657
  • ISSN : 1550-8781
  • Web of Science ID : WOS:000286942400054

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