1985年
Growth temperature dependence of intrinsic and extrinsic acceptor concentration in (Ga,Al)Sb evaluated by C-V characteristics of metal-insulator-semiconductor structures
Journal of Applied Physics
- ,
- ,
- 巻
- 57
- 号
- 4
- 開始ページ
- 1261
- 終了ページ
- 1265
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1063/1.335456
Growth temperature (TG) dependence of the acceptor concentrations (NA) in Al0.1Ga0.9Sb grown by liquid phase epitaxy in a very wide growth temperature range (250-500 °C) was investigated. It was found that NA varies with TG down to 350 °C as NA ∝exp(Ea/kBT G) with Ea=0.47 eV and that below 350 °C NA fluctuates depending highly on growth conditions. Acceptors in Al 0.1Ga0.9Sb grown above 350 °C were concluded to be intrinsic. These observations were successfully made using the improved extremely low-temperature growth process. The evaluation technique of measuring the impurity concentration in a thin epitaxial layer on the conductive GaSb substrate by C-V characteristics of metal-insulator-semiconductor structures was employed.
- リンク情報
- ID情報
-
- DOI : 10.1063/1.335456
- ISSN : 0021-8979
- SCOPUS ID : 0022010195