論文

査読有り
2017年10月

Fragmentation of multiply ionized CF3-CH2F induced by charge-changing collisions with fast carbon ions

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
  • Takuya Majima
  • ,
  • Taro Murai
  • ,
  • Shintaro Yoshida
  • ,
  • Manabu Saito
  • ,
  • Hidetsugu Tsuchida
  • ,
  • Akio Itoh

421
開始ページ
25
終了ページ
32
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.ijms.2017.05.017
出版者・発行元
ELSEVIER SCIENCE BV

We have investigated multiple ionization and fragmentation of 1,1,1,2-tetrafluoroethane (CF3-CH2F) in charge-changing collisions with 580-keV C. By measuring the number of emitted electrons in each collision, we obtained the charge state (r) distribution of multiply ionized CF3-CH2Fr+center dot ions transiently formed as intermediate states prior to fragmentation. The mean charge states of CF3-CH2Fr+center dot. in single electron (1e)-capture, le-loss, and double-electron-loss collisions were determined to be 1.9, 3.2, and 4.0, respectively. Time-of-flight mass spectra of the product ions from CF3-CH2Fr+center dot were obtained as a function of r from coincidence measurements with the number of emitted electrons. Production of specific fragment ions and variation of the fragmentation patterns were systematically revealed up to r=4. For example, it was found that proton emission becomes the dominant decay process from multiply ionized CF3-CH2Fr+center dot. The results also show that coincidence measurements can distinguish ion species with the same mass-to-charge ratio but different charge states. The characteristic features of the fragmentation processes of CF3-CH2Fr+center dot were investigated by the correlation among the product ions for r >= 2.C+ and C2+ fragment ions are emitted to the same side as H+ even at r = 2, reflecting the structural feature of the asymmetric location of the heavier atoms (F) in the molecule. (C) 2017 Elsevier B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.ijms.2017.05.017
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000414114100004&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.ijms.2017.05.017
  • ISSN : 1387-3806
  • eISSN : 1873-2798
  • Web of Science ID : WOS:000414114100004

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