吉田貞史 (Sadafumi Yoshida) - マイポータル

基本情報

"Measurements of the Depth Profile of the Refractive Incices in Oxide Films on SiC by Spectroscopic Ellipsometry

Japanese Journal of Applied Physics 41(2A) 800-804 2002年
"Measurements of the Depth Profile of the Refractive Incices in Oxide Films on SiC by Spectroscopic Ellipsometry

Takeshi Iida, Yuichi Tomioka, Kazuo Yoshimoto, Masahiko Midorikawa, Hiroyuki Tukada, Misao Orihara, Yasuto Hijikata, Hiroyuki Yaguchi, Masahito Yoshikawa, Hisayoshi Itoh …

Japanese Journal of Applied Physics 41(2A) 800-804 2002年
“Growth of cubic III-nitride semiconductors for electronics and optoelectronics application”

physica E 7(3-4) 907-914 2000年5月
“Optical constants of cubic GaN, AlN, and AlGaN alloys”

Japanese Journal of Applied Physics 39 L497-499 2000年
“Characterization of Oxide Films on SiC by Spectroscopic Ellipsometry”

IIDA T, TOMIOKA Y, HIJIKATA Y, YAGUCHI H, YOSHIKAWA M, ISHIDA Y, OKUMURA H, YOSHIDA S

Japanese Journal of Applied Physics, 39(10B) L1054-L1056 2000年
“Optical constants of cubic GaN, AlN, and AlGaN alloys”

Japanese Journal of Applied Physics 39 L497-499 2000年
“Characterization of Oxide Films on SiC by Spectroscopic Ellipsometry”

Japanese Journal of Applied Physics, 39(10B) L1054-L1056 2000年
“Growth of cubic III-nitride semiconductors for electronics and optoelectronics application”

physica E 2000年