論文

査読有り
2011年11月

Lateral critical current density distributions degraded near edges of coated conductors through cutting processes and their influence on ac loss characteristics of power transmission cables

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS
  • N. Amemiya
  • ,
  • Q. Li
  • ,
  • R. Nishino
  • ,
  • K. Takeuchi
  • ,
  • T. Nakamura
  • ,
  • K. Ohmatsu
  • ,
  • M. Ohya
  • ,
  • O. Maruyama
  • ,
  • T. Okuma
  • ,
  • T. Izumi

471
21-22
開始ページ
990
終了ページ
994
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.physc.2011.05.107
出版者・発行元
ELSEVIER SCIENCE BV

The critical current density (J(c)) near the edges of coated conductor could impact the ac loss characteristics of the cables comprising coated conductors. A wide coated conductor is often cut into narrower coated conductors in fabrication processes, and the J(c) might degrade near the edges of coated conductors through the cutting process. This possible degradation of J(c) could depend on cutting technology. Lateral J(c) distributions of coated conductors cut by using a mechanical slitter as well as a laser were measured by the magnetic knife method. The measured coated conductors are fabricated by PLD process on clad type textured-metal substrates with reduced magnetism. Based on the degradation of J(c) near the edges of coated conductors which was determined experimentally, ac losses of multi-layer cables as well as mono-layer cables were calculated numerically to evaluate the impact of the J(c) degradation near the edges of coated conductors on the their ac loss characteristics. (C) 2011 Elsevier B.V. All rights reserved.


リンク情報
DOI
https://doi.org/10.1016/j.physc.2011.05.107
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000297433400106&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.physc.2011.05.107
  • ISSN : 0921-4534
  • Web of Science ID : WOS:000297433400106

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