論文

査読有り
2011年

A NEW ILLUMINATION SYSTEM FOR DEFECT INSPECTION ON HIGHLY SPECULAR SURFACE

FOURTH INTERNATIONAL CONFERENCE ON COMPUTER AND ELECTRICAL ENGINEERING (ICCEE 2011)
  • Changjiang Li
  • ,
  • Zhong Zhang
  • ,
  • Takashi Imamura
  • ,
  • Tetsuo Miyaki

開始ページ
569
終了ページ
575
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
出版者・発行元
AMER SOC MECHANICAL ENGINEERS

This paper presented a new illumination system for defect inspection on the highly specular surface, especially for Chrome-plated surface. The surface is perfect specular, from which the diffuse reflection components are weak while specular reflection components are so strong that its intensity saturate the CCD matrix to causes some surface features to be lost. The square LED with white light pass through frosted glass and provides diffuse light source and a separate constant current source with intensity control were adopted. Diffuse illumination source with an optimum location impinge the specular surface also can reduce specular reflection from the surface and enhance the edge bright. But, variety of defects with different geometry shape maybe illuminated to perform specular reflection or covered by bright region in one image. So, a set of images are captured under the proposed illumination system. It is favorable for inspecting objects with highly reflective or uneven surfaces. By using of the system, some experiments defect inspection on chrome-plated surface show that the system is efficient and feasible.

リンク情報
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000320199600092&DestApp=WOS_CPL
ID情報
  • Web of Science ID : WOS:000320199600092

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