2007年6月
Growth of biaxially oriented conductive ITO buffer layers on textured Ni tapes for YBCO coated conductors
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
- ,
- ,
- ,
- ,
- ,
- ,
- ,
- ,
- 巻
- 17
- 号
- 2
- 開始ページ
- 3447
- 終了ページ
- 3450
- 記述言語
- 英語
- 掲載種別
- 研究論文（学術雑誌）
- DOI
- 10.1109/TASC.2007.898182
- 出版者・発行元
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
We investigated the effect of the Ar+ ion beam irradiation on removing NiO on the {100}< 001 > textured Ni tape surface, and the validity of the ITO as a conductive buffer layer. Excellent biaxial crystal orientations of the CeO2, YSZ and YBCO were achieved in the YBCO/YSZ/CeO2 prepared on the {100}< 001 > textured Ni tape, by irradiating the surface of the Ni tape before starting the deposition. The J(c) of the YBCO/YSZ/CeO2/Ni tape exceeded 2 MA/cm(2) at 77 K.
We also prepared the biaxially oriented YBCO on the ITO buffered Ni tape. We confirmed that ITO did not react with YBCO, and that ITO aligned biaxially on the {100}< 001 > textured Ni tape.
We also prepared the biaxially oriented YBCO on the ITO buffered Ni tape. We confirmed that ITO did not react with YBCO, and that ITO aligned biaxially on the {100}< 001 > textured Ni tape.
- リンク情報
- ID情報
-
- DOI : 10.1109/TASC.2007.898182
- ISSN : 1051-8223
- Web of Science ID : WOS:000248442900231