Misc.

Jan 10, 2008

Fault tolerance analysis for holographic memories in optically reconfigurable gate arrays

IEICE technical report
  • SHINOHARA Koji
  • ,
  • WATANABE Minoru

Volume
107
Number
415
First page
53
Last page
57
Language
Japanese
Publishing type
Publisher
The Institute of Electronics, Information and Communication Engineers

Recently, optically reconfigurable gate arrays (ORGAs) that enable high information processing speed are being developed. Such optically reconfigurable gate arrays consist of a laser diode array, a holographic memory, and a gate array VLSI, allowing fast reconfigurations and numerous reconfiguration contexts. Since an ORGA-VLSI can be programmed optically and in perfectly parallel, even if its gate array includes defect portions, the gate array can be used by avoiding such defect portions and by programming the same circuit to the other area. However, it is required that a holographic memory to support such programming must be dependable. So, this paper clarifies noise tolerance properties of holographic configurations.

Link information
CiNii Articles
http://ci.nii.ac.jp/naid/110006625492
CiNii Books
http://ci.nii.ac.jp/ncid/AN10013323
URL
http://id.ndl.go.jp/bib/9377456
ID information
  • ISSN : 0913-5685
  • CiNii Articles ID : 110006625492
  • CiNii Books ID : AN10013323

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