論文

査読有り
2017年9月

Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array

International System on Chip Conference
  • Takumi Fujimori
  • ,
  • Minoru Watanabe

2017-
開始ページ
91
終了ページ
95
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1109/SOCC.2017.8226014
出版者・発行元
IEEE Computer Society

Recently, field programmable gate arrays (FPGAs) are anticipated for use in high-radiation environments such as the Fukushima Daiichi nuclear power plant. According to recent news, regions with 650 Sv/h radiation have been found at the Fukushima Daiichi nuclear power plant. Under such extremely high radiation environments, high-speed scrubbing operations must be used to maintain correct circuit information on the configuration memory of programmable gate arrays. Up to now, optical high-speed scrubbing based on an optically reconfigurable gate array has been proposed. This paper presents a demonstration of the radiation tolerance of the optical high-speed scrubbing based on an optically reconfigurable gate array VLSI by using lasers that emulate strong radiation environments. It has been confirmed that 70-ns period high-speed scrubbing operations on the optically reconfigurable gate array are never disturbed by the emulated radiation.

リンク情報
DOI
https://doi.org/10.1109/SOCC.2017.8226014
URL
https://ieeexplore.ieee.org/document/8226014
ID情報
  • DOI : 10.1109/SOCC.2017.8226014
  • ISSN : 2164-1706
  • ISSN : 2164-1676
  • SCOPUS ID : 85044272040

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