MISC

1999年

Detection of the flip-flop motion of buckled dimers on a Ge(001) surface by STM

JOURNAL OF ELECTRON MICROSCOPY
  • T Sato
  • ,
  • M Iwatsuki
  • ,
  • H Tachihara

48
1
開始ページ
1
終了ページ
7
記述言語
英語
掲載種別
出版者・発行元
OXFORD UNIV PRESS

The dynamic behaviour of surface dimers on Ge(001) has been investigated using a variable-temperature (VT) STM. It is clarified that symmetric-appearing dimers, which are generally observed in terraces of Ge(001) at room temperature by STM, are inherently buckled and that the flip-flop motion of buckled dimers is the origin of their symmetric appearance. The evidence of the flip-flop motion was detected by monitoring tunnelling current at positions above selected atoms in symmetric-appearing dimers, as a function of time. It is found that event rate of the flip-flop motion taking place in symmetric-appearing dimers is lowered considerably with decreasing temperature. It is demonstrated that the time-dependent tunnelling-current measurement at positions above selected surface-atoms by using atom-resolved VT-STM provides fruitful information concerning dynamic processes of surface atoms.

リンク情報
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000078548100001&DestApp=WOS_CPL
ID情報
  • ISSN : 0022-0744
  • Web of Science ID : WOS:000078548100001

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