2016年
Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2
TMU INTERNATIONAL SYMPOSIUM ON NEW QUANTUM PHASES EMERGING FROM NOVEL CRYSTAL STRUCTURE
- 巻
- 683
- 号
- 開始ページ
- 0012003
- 終了ページ
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- DOI
- 10.1088/1742-6596/683/1/012003
- 出版者・発行元
- IOP PUBLISHING LTD
Bulk electronic structure of novel layered superconductor Nd(O,F)BiS2 was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS2 and La(O,F)BiS2, we discuss possible important factors for the superconductivity in this series of material.
- リンク情報
- ID情報
-
- DOI : 10.1088/1742-6596/683/1/012003
- ISSN : 1742-6588
- Web of Science ID : WOS:000372176100003