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Peer-reviewed
May, 2006

Measurement of CP violation in B-0 -> D*-pi(+) and B-0 -> D-pi(+) decays

PHYSICAL REVIEW D
  • F. J. Ronga
  • T. R. Sarangi
  • K. Abe
  • I. Adachi
  • H. Aihara
  • D. Anipko
  • K. Arinstein
  • Y. Asano
  • T. Aushev
  • S. Bahinipati
  • A. M. Bakich
  • V. Balagura
  • E. Barberio
  • M. Barbero
  • K. Belous
  • U. Bitenc
  • I. Bizjak
  • S. Blyth
  • A. Bondar
  • A. Bozek
  • M. Bracko
  • T. E. Browder
  • P. Chang
  • A. Chen
  • W. T. Chen
  • B. G. Cheon
  • R. Chistov
  • Y. Choi
  • A. Chuvikov
  • J. Dalseno
  • M. Danilov
  • M. Dash
  • A. Drutskoy
  • S. Eidelman
  • D. Epifanov
  • S. Fratina
  • N. Gabyshev
  • A. Garmash
  • T. Gershon
  • G. Gokhroo
  • B. Golob
  • A. Gorisek
  • J. Haba
  • K. Hara
  • T. Hara
  • K. Hayasaka
  • H. Hayashii
  • M. Hazumi
  • T. Higuchi
  • L. Hinz
  • T. Hokuue
  • Y. Hoshi
  • S. Hou
  • W. -S. Hou
  • T. Iijima
  • K. Inami
  • A. Ishikawa
  • H. Ishino
  • R. Itoh
  • Y. Iwasaki
  • J. H. Kang
  • H. Kawai
  • T. Kawasaki
  • H. R. Khan
  • H. J. Kim
  • K. Kinoshita
  • S. Korpar
  • P. Krokovny
  • R. Kulasiri
  • R. Kumar
  • C. C. Kuo
  • Y. -J. Kwon
  • G. Leder
  • J. Lee
  • T. Lesiak
  • J. Li
  • A. Limosani
  • D. Liventsev
  • G. Majumder
  • F. Mandl
  • T. Matsumoto
  • W. Mitaroff
  • K. Miyabayashi
  • H. Miyake
  • H. Miyata
  • D. Mohapatra
  • T. Nagamine
  • I. Nakamura
  • E. Nakano
  • Z. Natkaniec
  • S. Nishida
  • O. Nitoh
  • S. Noguchi
  • T. Nozaki
  • S. Ogawa
  • T. Ohshima
  • S. Okuno
  • S. L. Olsen
  • Y. Onuki
  • P. Pakhlov
  • C. W. Park
  • H. Park
  • L. S. Peak
  • R. Pestotnik
  • L. E. Piilonen
  • A. Poluektov
  • M. Rozanska
  • Y. Sakai
  • N. Sato
  • N. Satoyama
  • K. Sayeed
  • T. Schietinger
  • O. Schneider
  • A. J. Schwartz
  • R. Seidl
  • K. Senyo
  • M. E. Sevior
  • M. Shapkin
  • H. Shibuya
  • B. Shwartz
  • J. B. Singh
  • A. Sokolov
  • A. Somov
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  • S. Stanic
  • M. Staric
  • H. Stoeck
  • K. Sumisawa
  • S. Suzuki
  • S. Y. Suzuki
  • F. Takasaki
  • M. Tanaka
  • Y. Teramoto
  • X. C. Tian
  • K. Trabelsi
  • T. Tsukamoto
  • S. Uehara
  • K. Ueno
  • S. Uno
  • P. Urquijo
  • Y. Ushiroda
  • Y. Usov
  • G. Varner
  • K. E. Varvell
  • S. Villa
  • C. H. Wang
  • Y. Watanabe
  • E. Won
  • Q. L. Xie
  • B. D. Yabsley
  • A. Yamaguchi
  • Y. Yamashita
  • M. Yamauchi
  • J. Ying
  • C. C. Zhang
  • L. M. Zhang
  • Z. P. Zhang
  • V. Zhilich
  • D. Zuercher
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Volume
73
Number
9
First page
1
Last page
17
Language
English
Publishing type
Research paper (scientific journal)
DOI
10.1103/PhysRevD.73.092003
Publisher
AMER PHYSICAL SOC

We report measurements of time-dependent decay rates for B-0 -> D(*)-pi(+) decays and extraction of CP violation parameters that depend on phi(3). Using fully reconstructed D-(*)pi events and partially reconstructed D-*pi events from a data sample that contains 386x10(6) B (B) over bar pairs that was collected near the Upsilon(4S) resonance, with the Belle detector at the KEKB asymmetric energy e(+)e(-) collider, we obtain the CP violation parameters S+(D-(*)pi) and S-(D-(*)pi). We obtain S+(D-*pi)=0.049 +/- 0.020(stat)+/- 0.011(sys), S-(D-*pi)=0.031 +/- 0.019(stat)+/- 0.011(sys), and S+(D pi)=0.031 +/- 0.030(stat)+/- 0.012(sys), S-(D pi)=0.068 +/- 0.029(stat)+/- 0.012(sys). These results are an indication of CP violation in B-0 -> D*-pi(+) and B-0 -> D-pi(+) decays at the 2.5 sigma and 2.2 sigma levels, respectively. If we use the values of R-D((*))pi that are derived using assumptions of factorization and SU(3) symmetry, branching fraction measurements for the B -> D-s((*))pi modes, and lattice QCD calculations, we can restrict the allowed region of \sin(2 phi(1)+phi(3)\ to be above 0.44 and 0.52 at 68% confidence level from the D-*pi and D pi modes, respectively.

Link information
DOI
https://doi.org/10.1103/PhysRevD.73.092003
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000237950900006&DestApp=WOS_CPL
ID information
  • DOI : 10.1103/PhysRevD.73.092003
  • ISSN : 2470-0010
  • eISSN : 2470-0029
  • Web of Science ID : WOS:000237950900006

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