MISC

2003年9月1日

銅プリント配線板における WDT 法による短絡電流とデンドライトの三次元形状の関係

電気学会論文誌. A, 基礎・材料・共通部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A, A publication of Fundamentals and Materials Society
  • 唐 超
  • ,
  • 水戸部 一孝
  • ,
  • 吉村 昇

123
9
開始ページ
932
終了ページ
938
記述言語
日本語
掲載種別
DOI
10.1541/ieejfms.123.932
出版者・発行元
一般社団法人 電気学会

In this paper, the 3-dimensional form of the dendrite generated by the WTD method was measured using the 3-dimensional form measurement system. We had also investigated about a change of the short-circuit current while changing protection resistance and the dendrite with the passage of time. Consequently, after failure, in nonuniform electric field electrode it turns out that there is more accumulation thing at the anode than the cathode. In uniform electric field, if the maximum current is less than 0.1[mA], then the accumulate thing at cathode. If the maximum current is more than 0.1[mA], then the amount of accumulation at anode is larger than of cathode. The amount of generating per unit electric charge and the protection resistance holds a linear relation. The volume of the accumulation thing per unit electric charge grows larger with the increase of protection resistance. But it decreases if the time after failure becomes longer. For a same protection resistance, it turns out that the amount of generating per unit electric charge is smaller in nonuniform electric field than the uniform electric field. The current at the field strength differs form the failure current. And the action state of the accumulation thing after failure varies with the protection resistance, the failure time is shorter in the large environment. We also consider the progress speed of the accumulation thing after failure is faster. We think that this point is important to design a circuit pattern and a circuit.

リンク情報
DOI
https://doi.org/10.1541/ieejfms.123.932
CiNii Articles
http://ci.nii.ac.jp/naid/10011750261
CiNii Books
http://ci.nii.ac.jp/ncid/AN10136312
URL
http://id.ndl.go.jp/bib/6693322
ID情報
  • DOI : 10.1541/ieejfms.123.932
  • ISSN : 0385-4205
  • CiNii Articles ID : 10011750261
  • CiNii Books ID : AN10136312

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