2017年2月
Sensitive monitoring of photocarrier densities in the active layer of a photovoltaic device with time-resolved terahertz reflection spectroscopy
APPLIED PHYSICS LETTERS
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- 巻
- 110
- 号
- 7
- 開始ページ
- 71108
- 終了ページ
- 071108/5
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1063/1.4975631
- 出版者・発行元
- AMER INST PHYSICS
We demonstrate the sensitive measurement of photocarriers in an active layer of a GaAs-based photovoltaic device using time-resolved terahertz reflection spectroscopy. We found that the reflection dip caused by Fabry-Perot interference is strongly affected by the carrier profile in the active layer of the p-i-n structure. The experimental results show that this method is suitable for quantitative evaluation of carrier dynamics in active layers of solar cells under operating conditions. Published by AIP Publishing.
- リンク情報
- ID情報
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- DOI : 10.1063/1.4975631
- ISSN : 0003-6951
- eISSN : 1077-3118
- Web of Science ID : WOS:000394761700008