2000年4月
Absolute measurement of total photo desorption yield of solid neon in vacuum ultraviolet range
SURFACE SCIENCE
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- 巻
- 451
- 号
- 1-3
- 開始ページ
- 136
- 終了ページ
- 142
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- 出版者・発行元
- ELSEVIER SCIENCE BV
Absolute yields of photo-induced desorption at the surface of solid Ne have been measured at wavelengths of incident light between 25 and 100 nm. There is a strong dependence of the total desorption yield of Ne on both the excitation energy and the thickness of Ne films. On a thick him, the desorption yield is 1-2 atoms per photon by bulk exciton excitation and 2-10 atoms per photon by bulk ionization. These values are quantitatively explained by an internal sputtering mechanism. By the surface exciton excitation, the yield is 0.1-0.3 atoms per photon, which value means that the desorption probability of the surface exciton is almost unity. (C) 2000 Elsevier Science B.V. All rights reserved.
- リンク情報
- ID情報
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- ISSN : 0039-6028
- Web of Science ID : WOS:000086742300020