論文

2000年4月

Absolute measurement of total photo desorption yield of solid neon in vacuum ultraviolet range

SURFACE SCIENCE
  • Arakawa, I
  • ,
  • T Adachi
  • ,
  • T Hirayama
  • ,
  • M Sakurai

451
1-3
開始ページ
136
終了ページ
142
記述言語
英語
掲載種別
研究論文(学術雑誌)
出版者・発行元
ELSEVIER SCIENCE BV

Absolute yields of photo-induced desorption at the surface of solid Ne have been measured at wavelengths of incident light between 25 and 100 nm. There is a strong dependence of the total desorption yield of Ne on both the excitation energy and the thickness of Ne films. On a thick him, the desorption yield is 1-2 atoms per photon by bulk exciton excitation and 2-10 atoms per photon by bulk ionization. These values are quantitatively explained by an internal sputtering mechanism. By the surface exciton excitation, the yield is 0.1-0.3 atoms per photon, which value means that the desorption probability of the surface exciton is almost unity. (C) 2000 Elsevier Science B.V. All rights reserved.

リンク情報
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000086742300020&DestApp=WOS_CPL
ID情報
  • ISSN : 0039-6028
  • Web of Science ID : WOS:000086742300020

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