Apr 20, 2000
Absolute measurement of total photo desorption yield of solid neon in vacuum ultraviolet range
Surface Science
- ,
- ,
- ,
- Volume
- 451
- Number
- 1
- First page
- 136
- Last page
- 142
- Language
- English
- Publishing type
- Research paper (scientific journal)
- DOI
- 10.1016/S0039-6028(00)00019-4
- Publisher
- Elsevier Science B.V.
Absolute yields of photo-induced desorption at the surface of solid Ne have been measured at wavelengths of incident light between 25 and 100 nm. There is a strong dependence of the total desorption yield of Ne on both the excitation energy and the thickness of Ne films. On a thick film, the desorption yield is 1-2 atoms per photon by bulk exciton excitation and 2-10 atoms per photon by bulk ionization. These values are quantitatively explained by an internal sputtering mechanism. By the surface exciton excitation, the yield is 0.1-0.3 atoms per photon, which value means that the desorption probability of the surface exciton is almost unity.
- Link information
- ID information
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- DOI : 10.1016/S0039-6028(00)00019-4
- ISSN : 0039-6028
- SCOPUS ID : 0033750144