Papers

Apr 20, 2000

Absolute measurement of total photo desorption yield of solid neon in vacuum ultraviolet range

Surface Science
  • I. Arakawa
  • ,
  • T. Adachi
  • ,
  • T. Hirayama
  • ,
  • M. Sakurai

Volume
451
Number
1
First page
136
Last page
142
Language
English
Publishing type
Research paper (scientific journal)
DOI
10.1016/S0039-6028(00)00019-4
Publisher
Elsevier Science B.V.

Absolute yields of photo-induced desorption at the surface of solid Ne have been measured at wavelengths of incident light between 25 and 100 nm. There is a strong dependence of the total desorption yield of Ne on both the excitation energy and the thickness of Ne films. On a thick film, the desorption yield is 1-2 atoms per photon by bulk exciton excitation and 2-10 atoms per photon by bulk ionization. These values are quantitatively explained by an internal sputtering mechanism. By the surface exciton excitation, the yield is 0.1-0.3 atoms per photon, which value means that the desorption probability of the surface exciton is almost unity.

Link information
DOI
https://doi.org/10.1016/S0039-6028(00)00019-4
ID information
  • DOI : 10.1016/S0039-6028(00)00019-4
  • ISSN : 0039-6028
  • SCOPUS ID : 0033750144

Export
BibTeX RIS