2000年4月20日
Absolute measurement of total photo desorption yield of solid neon in vacuum ultraviolet range
Surface Science
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- ,
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- 巻
- 451
- 号
- 1
- 開始ページ
- 136
- 終了ページ
- 142
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1016/S0039-6028(00)00019-4
- 出版者・発行元
- Elsevier Science B.V.
Absolute yields of photo-induced desorption at the surface of solid Ne have been measured at wavelengths of incident light between 25 and 100 nm. There is a strong dependence of the total desorption yield of Ne on both the excitation energy and the thickness of Ne films. On a thick film, the desorption yield is 1-2 atoms per photon by bulk exciton excitation and 2-10 atoms per photon by bulk ionization. These values are quantitatively explained by an internal sputtering mechanism. By the surface exciton excitation, the yield is 0.1-0.3 atoms per photon, which value means that the desorption probability of the surface exciton is almost unity.
- ID情報
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- DOI : 10.1016/S0039-6028(00)00019-4
- ISSN : 0039-6028
- SCOPUS ID : 0033750144