Kenichi Kataoka

Profile Information

Affiliation: Former Institution /Organization Fine Digital Engineering Laboratory

Degree: Master of Engineering(The University of Tokyo)

J-GLOBAL ID: 200901092842837561
researchmap Member ID: 1000367719

Research Interests

Research Areas

Manufacturing technology (mechanical, electrical/electronic, chemical engineering) / Electronic devices and equipment /
Nanotechnology/Materials / Applied physics - general /

Research History

2001 - 2003

Research Center for Advanced Science and Technology, The University of Tokyo
2001 - 2003

Research Associate, Research Center for
University of Tokyo
Advanced Science and Technology, the

Education

- 2001

The University of Tokyo
- 2001

Graduate School, Division of Engineering, The University of Tokyo
- 1997

The Faculty of Engineering, The University of Tokyo
- 1997

Faculty of Engineering, The University of Tokyo

Misc.

Multi-layer electroplated micro-spring array for MEMS probe card

Technical Digest of 17th IEEE International Conference on Micro Electro Mechanical Systems, 733, 2004
Multi-layer electroplated micro-spring array for MEMS probe card

Technical Digest of 17th IEEE International Conference on Micro Electro Mechanical Systems, 733, 2004
Characterization of fritting phenomena on al electrode for low contact force probe card

K Kataoka, T Itoh, T Suga

IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 26(2) 382-387, Jun, 2003
Characterization of fritting phenomena on al electrode for low contact force probe card

K Kataoka, T Itoh, T Suga

IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 26(2) 382-387, Jun, 2003
Low contact force fritting probe card using buckling microcantilevers.

Proceedings of International Test Conference 2003 (ITC2003), 1009-1013, 2003
Electroplating Ni micro-cantilevers for low contact-force IC probing

Sensors and Actuators A, 103 166-121, 2003
Low contact force fritting probe card using buckling microcantilevers.

Proceedings of International Test Conference 2003 (ITC2003), 1009-1013, 2003
Electroplating Ni micro-cantilevers for low contact-force IC probing

Sensors and Actuators A, 103 166-121, 2003
Low contact-force and compliant MEMS probe card utilizing fritting contact

Technical Digest of International Conference on Micro Electro Mechanical Systems 2002, 364, 2002
Low contact force probing on Cu electrodes

Proceedings of International Test Conference 2002, 424, 2002
Low contact-force and compliant MEMS probe card utilizing fritting contact

Technical Digest of International Conference on Micro Electro Mechanical Systems 2002, 364, 2002
Low contact force probing on Cu electrodes

Proceedings of International Test Conference 2002, 424, 2002
Applicability of fritting contacts to micromachined probe cards

Toshihiro Itoh, Kenichi Kataoka, Tadatomo Suga

Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 67(8) 1239-1243, 2001
3-Dimensional piezodriven microcantilever for scanning force microscope

Kenichi Kataoka, Jiaru Chu, Ryutaro Maeda, Toshihiro Itoh, Tadatomo Suga

Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 66(6) 965-969, Jun, 2000
走査型力顕微鏡のための三次元駆動圧電マイクロカンチレバー

片岡憲一, 前田龍太郎, 伊藤寿浩, 須賀唯知

精密工学会誌, 66(6) 965-969, 2000
Fritting Contacts utilized for micromachined wafer probe card

Proceedings-International Conference and Poster Exhibition on Micro Materials(Micro Mat 2000), 967, 2000

Profile Information

Research Interests

Research Areas

Research History

Education

Misc.

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