長谷川 明

Structure and chemical changes of CeO2 irradiated with hydrogen. to be published in Nuclear Instruments and Methods B. 

  

EELS及びエネルギーフィルター電子顕微鏡法によるAl中希ガス折出物構造変化の解析 

日本金属学会誌、65, 2001, 343-8.  

The temperature dependance of phass transformation induced with ion irradiation in 304 stainless steel. Proc. the 19th symposium of materials science and engineering research center of ion beam technology Hosei University 

Research Center of Ion Beam Technology Hosei University, Dec. 13-14, 2000, Hosei Univ. Tokyo, Japan, p.61-9.  

Danamic process of nano-structured inert gas precipitates induced with implantation in Al. to be published in J Electron Microsc. 

  

Structure of a phase induced with Xe-ion irradiation/implantaion in gamma-TiAl. 

Phil. Mag. Letts, 80, 2000, 661-8.  

HRTEM observation of argon precipitates in aluminum introduced with ion implantation, Proc. the 5th int. symp. on advanced physical fields Fabrication and haracterization of atomic scale structures 

Natl. Res. Inst. for Metals, (2000) p.71-6.  

Structure change in gamma-TiAl alloys induced by inert gas ion irradiation 

Trans. Mater. Res. Soc. Japan, 25, 2000, 1123-6.  

Factors related to structure change of gamma-TiAl alloys under inert gas ion implantation/irradiation, Proc. the 18th symposium of materials science and engineering research center of ion beam technology Hosei University 

Research Center of Ion Beam Technology Hosei University, (1999) p.173-8.  

Morphologies of metastable inert gas precipitates in aluminum observed with in-situ HRTEM. 

Mater. Sci. Eng. A, 304-306, 2000, 136-43.  

High Resolution electron microscopy study of defect structures in gamma-TiAl irradiated with 15 KeV He ions in a HVTEM 

J. Electron Microsc., 48, 1999, 355-360. J. Electron Microsc., 48, 1999, 591-4.  

EELS spectroscopy and energy filtered imaging of Xe avities embedded in Al at 423 K and 473 K. 

Micron, 30, 1999, 129-33.  

EELS and TEM studies on NaOH solution treated p-type porous silicon after anodization. Proc. the 14th Inter. Congress on Electron Microscopy, ed. H. A. C. Benavides, H.A.C; Yacaman, M. J. Institute of Physics Publishing 

Bristol and Philadelphia, 3, 1998, 621-2.  

Energy loss spectroscopy and electron microscopy of photoluminescent p-type porous silicon treated with NaOH solution. 

J. Surface Analysis, 4, 1998, 365-71.  

Correlation between photoluminescence and local chemical states of p-type porous silicon by means of electron energy loss spectroscopy 

J. Surface Analysis, 3, 1997, 446-50.  

Cross sectional observation of LSI by high resolution TEM. Proc. the 12th Int. Cong. for Electron Microscopy 

San Francisco Press Inc., 1990, 634-5.