深野 天

Separation of measurement of the refractive index and the geometrical thickness by use of a wavelength-scanning interferometer with a confocal microscope 

Applied Optics 38(19) 4065-4073 1999年7月1日  

Simultaneous measurement of thicknesses and refractive indices of multiple layers by a low-coherence confocal interference microscope 

Optics Letters 21(23) 1942-1944 1996年12月1日