MISC

2004年2月

Behavior of Cu(In,Ga)Se-2 solar cells under light/damp heat over time

MICROELECTRONICS RELIABILITY
  • T Yanagisawa
  • ,
  • T Kojima
  • ,
  • T Koyanagi

44
2
開始ページ
229
終了ページ
235
記述言語
英語
掲載種別
DOI
10.1016/S0026-2714(03)00355-X
出版者・発行元
PERGAMON-ELSEVIER SCIENCE LTD

We performed accelerated tests on various sealed CIGS solar cells in a complex light/damp heat environment, and investigated the behavior of P-max and other properties over time. The half-life time of P-max in well-sealed cells was found to be 40-80 times greater than that in non-sealed cells, and the degradation of P-max was dependent on changes in V-oc and FF. The cause of these changes was examined based on the behavior of photo IV characteristics under conditions of feeble light, dark IV, and CV. (C) 2003 Elsevier Ltd. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/S0026-2714(03)00355-X
CiNii Articles
http://ci.nii.ac.jp/naid/80016513545
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000188958300006&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/S0026-2714(03)00355-X
  • ISSN : 0026-2714
  • CiNii Articles ID : 80016513545
  • Web of Science ID : WOS:000188958300006

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