金丸 正剛

Precise control of field emission current by a built-in poly-Si thin film transistor 

Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV 2 853-856 2006年  

Doping integrity diagnostics of planar transistor channel structures by scanning nonlinear dielectric microscopy 

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 24(1) 237-244 2006年1月  

Demonstration, analysis, and device design considerations for independent DG MOSFETs 

IEEE TRANSACTIONS ON ELECTRON DEVICES 52(9) 2046-2053 2005年9月  

Emission statistics for HfC emitter arrays after residual gas exposure 

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 44(8) 5959-5963 2005年8月  

Silicon field emission array as novel charge neutralization device for high current ion implanter 

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 237(1-2) 390-394 2005年8月  

Fabrication of HfC-coated Si field emitter arrays with built-in poly-Si thin-film transistor 

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 44(7B) 5740-5743 2005年7月  

General analytical relationship for electric field of gated field emitters 

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 44(6A) 3854-3859 2005年6月  

Work function controllability of metal gates made by interdiffusing metal stacks with low and high work functions 

MICROELECTRONIC ENGINEERING 80 284-287 2005年6月  

Ring-shaped images as a result of nonuniform field emission from capped carbon nanotubes 

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 23(2) 649-656 2005年3月  

Emission statistics for Si and HfC emitter arrays after residual gas exposure 

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 23(2) 707-717 2005年3月  

Scanning tunneling microscopy observations of hafnium carbide thin films as a field emission material 

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 23(2) 741-744 2005年3月  

Work function uniformity of Al-Ni alloys obtained by scanning Maxwell-stress microscopy as an effective tool for evaluating metal transistor gates 

APPLIED PHYSICS LETTERS 86(9) 094104-1-094104-3 2005年2月  

Modeling of focused carbon nanotube array emitters for field-emission displays 

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 43(6A) 3328-3334 2004年6月  

Fabrication of polycrystalline silicon field emitter arrays with hafnium carbide coating for thin-film-transistor controlled field emission displays 

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 43(6B) 3919-3922 2004年6月  

Characterization of enhanced field emission from HfC-coated Si emitter arrays through parameter extraction 

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 22(3) 1227-1233 2004年5月  

Diagnostics of doping integrity in n(/)(+)p/n(+) transistor-channel structure by scanning nonlinear dielectric microscopy 

APPLIED PHYSICS LETTERS 84(16) 3169-3171 2004年4月