池田 弥央

Multiple-Step Electron Charging in Si Quantum-Dot Floating Gate MOS Memories (共著) 

Digest of Papers Microprocesses and Nanotechnology 2002 pp. 116-117 2002年  

Control of The Positioning of Self-Assmbling Si Quantum Dots on Ultrathin SiO2/c-Si by Using Scanning Probe (共著) 

Digest of Papers Microprocesses and Nanotechnology 2001 pp. 282-283 2001年  

Charge Injection Characteristics of a Si Quantum Dot Floating Gate in MOS Structures (共著) 

Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials pp. 308-309 2001年  

Control of self-assembling formation of nanometer silicon dots by low pressure chemical vapor deposition (共著) 

Thin Solid Films 369, pp. 55-59 2000年  

Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique (共著) 

Japanese Journal of Applied Physics Vol. 39, Part 1, No. 4B, pp. 2318-2320 2000年  

Quantum confinement effect in self-assembled, nanometer silicon dots 

Applied Physics Letters Vol. 73, No. 26,pp. 3881-3883 1998年  

Single Electron Charging to a Si Quantum Dot Floating Gate in MOS Structures (共著) 

Extended Abstracts of the 1998 International Conference on Solid State Devices and Materials pp. 174-175 1998年  

Electron Charging to Silicon Quantum Dots as a Floating Gate in MOS Capacitors (共著) 

Extended Abstracts of the 1997 International Conference on Solid State Devices and Materials pp. 566-567 1997年