MISC

査読有り
2017年

The evaluation of the Hitomi (Astro-H)/SXS spare beryllium window in 3.8-30 keV

Proceedings of SPIE - The International Society for Optical Engineering
  • Akio Hoshino
  • ,
  • Yuki Yoshida
  • ,
  • Shunji Kitamoto
  • ,
  • Ryuichi Fujimoto
  • ,
  • Noriko Y. Yamasaki
  • ,
  • Toshiaki Ina
  • ,
  • Tomoya Uruga
  • ,
  • Megan Eckart
  • ,
  • Maurice Leutenegger

10397
記述言語
英語
掲載種別
DOI
10.1117/12.2272899
出版者・発行元
SPIE

During the Hitomi (Astro-H) commissioning observations the SXS dewar gate valve (GV) remained closed to protect the instrument from initial spacecraft outgassing. As a result, the optical path of the observations included the Be window installed on the GV. Both x-ray fluorescence (XRF) analysis and x-ray transmission measurements were performed in June 2016 on the flight-spare Be window which is the same lot as the flight material at SPring-8 in Japan. The beamline operating range is 3.8-30 keV. We used a beam spot size of 1 mm × 0.2 mm to measure two positions on the Be window, at the center of the window and at one position 6.5 mm off-center. We used simultaneous transmission measurements of standard materials for energy calibration. The transmission data clearly showed Fe and Ni K-edges, plus a marginal detection of the Mn K-edge. We found that our transmission data was best fit using the following component Be: 261.86±0.01μm, Cr: 3nm (fixed), Mn: 3.81±0.05nm, Fe: 10.83±0.05nm, Ni: 16.48±0.03nm, Cu: 5nm (fixed). The transmission is reduced 1% at the Fe K-edge. The amount of contaminated materials are comparable to the values of the value provided by the vender. The surface transmission is strained with σ = 0.11% of the unbiased standard deviation calculated variation in the residuals between the measured value and the model.

リンク情報
DOI
https://doi.org/10.1117/12.2272899
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000417112900009&DestApp=WOS_CPL
ID情報
  • DOI : 10.1117/12.2272899
  • ISSN : 1996-756X
  • ISSN : 0277-786X
  • ORCIDのPut Code : 46310746
  • SCOPUS ID : 85033451212
  • Web of Science ID : WOS:000417112900009

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