論文

査読有り
2019年

Achievements of NEDO Durability Projects on SOFC Stacks in the Light of Physicochemical Mechanisms

Fuel Cells
  • H. Yokokawa
  • M. Suzuki
  • M. Yoda
  • T. Suto
  • K. Tomida
  • K. Hiwatashi
  • M. Shimazu
  • A. Kawakami
  • H. Sumi
  • M. Ohmori
  • T. Ryu
  • N. Mori
  • M. Iha
  • S. Yatsuzuka
  • K. Yamaji
  • H. Kishimoto
  • K. Develos-Bagarinao
  • T. Shimonosono
  • K. Sasaki
  • S. Taniguchi
  • T. Kawada
  • M. Muramatsu
  • K. Terada
  • K. Eguchi
  • T. Matsui
  • H. Iwai
  • M. Kishimoto
  • N. Shikazono
  • Y. Mugikura
  • T. Yamamoto
  • M. Yoshikawa
  • K. Yasumoto
  • K. Asano
  • Y. Matsuzaki
  • K. Sato
  • T. Somekawa
  • 全て表示

19
4
開始ページ
311
終了ページ
339
記述言語
掲載種別
研究論文(学術雑誌)
DOI
10.1002/fuce.201800187

© 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Achievements of NEDO durability projects on SOFC mode are summarized with a focus on the physicochemical mechanisms characterized by diffusion properties of cell components and chemical reactions of cell components with gaseous impurities. Ni sintering and depletion including impurity (P, B, S) effects have been examined in terms of the surface/interface energies of Ni/oxide cermet anodes. The conductivity degradation due to the transformation of the cubic YSZ electrolyte was found to be characterized in terms of two time constants for the reductive and the oxidative regions to be determined by the Y-diffusivity and its enhancement on NiO internal reduction in YSZ, while observed gaps in conductivity degradation behavior between stacks and button cells were ascribed to differences in those physicochemical properties involved, namely cation diffusion and kinetics associated with NiO internal reduction. The cathode performance degradation due to sulfur poisoning exhibits a variety of dependences on the microstructure (dense or porous) of doped-ceria interlayers, the thickness of YSZ electrolyte and the humidity in the anode atmosphere, suggesting effects of protons in the cathode vicinity and the SrO activity changes during fabrication the LSCF/GDC/YSZ multilayers. Some defect chemical considerations were made on how such defects are affected by fabrication processes.

リンク情報
DOI
https://doi.org/10.1002/fuce.201800187
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85067043463&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85067043463&origin=inward
URL
http://orcid.org/0000-0002-9830-2669
ID情報
  • DOI : 10.1002/fuce.201800187
  • ISSN : 1615-6846
  • eISSN : 1615-6854
  • ORCIDのPut Code : 59296754
  • SCOPUS ID : 85067043463

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