着本 享

Correlation between the Electrical Properties and the Interfacial Microstructures of TiAl- Based Ohmic Contacts to p-type 4H-SiC 

Journal of Electronic Materials vol.33, pp.460-466 2004年  

Direct observation of the Atomic structure in a Solid-Liquid Interface 

Microscopy and Microanalysis Vol.6, pp.358-361 2000年  

Direct observation of the Atomic structure in a Solid-Liquid Interface 

Microscopy and Microanalysis Vol.6, pp.358-361 2000年  

High-resolution in-situ electron microscopy of a Si surface modification by molten Al at high temperature 

Philosophical Magazine Letters Vol.79, pp.913-918 1999年  

High-resolution in-situ electron microscopy of a Si surface modification by molten Al at high temperature 

Philosophical Magazine Letters Vol.79, pp.913-918 1999年