MISC

2013年7月15日

Current density enhancement nano-contact phase-change memory for low writing current

Applied Physics Letters
  • You Yin
  • ,
  • Sumio Hosaka
  • ,
  • Woon Ik Park
  • ,
  • Yeon Sik Jung
  • ,
  • Keon Jae Lee
  • ,
  • Byoung Kuk You
  • ,
  • Yang Liu
  • ,
  • Qi Yu

103
3
開始ページ
033116 1-5
終了ページ
記述言語
英語
掲載種別
DOI
10.1063/1.4816080

In this work, a phase-change memory (PCM) with self-assembled nanostructures and an oxidized thin phase-change layer is proposed and intensively investigated for low writing reset current by finite element analysis. Current density is significantly enhanced in our nano-contact memory because of the existence of nanostructures and oxidized phase-change layer. The writing current of our proposed memory is about 1/10-3/10 that of conventional cell, which is in good agreement with our experimental results. The heat efficiency in the nano-contact PCM cell is greatly improved and its power consumption can be as low as about 1/10 that of the conventional cell. © 2013 AIP Publishing LLC.

リンク情報
DOI
https://doi.org/10.1063/1.4816080
ID情報
  • DOI : 10.1063/1.4816080
  • ISSN : 0003-6951
  • SCOPUS ID : 84881483943

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