MISC

2013年

Measurement of coercive force enhanced by nanometer-sizing of magnetic dot by X-ray magnetic circular dichroism (XMCD)

ADVANCED MICRO-DEVICE ENGINEERING III
  • Sumio Hosaka
  • ,
  • Zulfakri Mohamad
  • ,
  • You Yin
  • ,
  • Hiroshi Sakurai
  • ,
  • Yuji Kondo
  • ,
  • Jun Ariake
  • ,
  • Naoki Honda
  • ,
  • Motohiro Suzuki

534
開始ページ
122
終了ページ
+
記述言語
英語
掲載種別
DOI
10.4028/www.scientific.net/KEM.534.122
出版者・発行元
TRANS TECH PUBLICATIONS LTD

We have studied the coercive force of fine magnetic CoPt dot enhanced by nanometer-sizing of the dot. The 39- to 106-nm-sized CoPt magnetic dot arrays were formed by30-keV-electron beam (EB) drawing with thin calixarene resist and 200-eV-Ar ion milling. Using the fine magnetic dot arrays, we measured coercive forces of the dot by x-ray magnetic circular dichroism (XMCD) with an energy of 11.56 keV, which corresponds to an energy edge of Pt-L3. It is experimentally demonstrated that a coercive force of the nanometer-sized magnetic column increased as the dot diameter decreased.

リンク情報
DOI
https://doi.org/10.4028/www.scientific.net/KEM.534.122
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000316642000023&DestApp=WOS_CPL
ID情報
  • DOI : 10.4028/www.scientific.net/KEM.534.122
  • ISSN : 1013-9826
  • Web of Science ID : WOS:000316642000023

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