2013年
Measurement of coercive force enhanced by nanometer-sizing of magnetic dot by X-ray magnetic circular dichroism (XMCD)
ADVANCED MICRO-DEVICE ENGINEERING III
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- 巻
- 534
- 号
- 開始ページ
- 122
- 終了ページ
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- 記述言語
- 英語
- 掲載種別
- DOI
- 10.4028/www.scientific.net/KEM.534.122
- 出版者・発行元
- TRANS TECH PUBLICATIONS LTD
We have studied the coercive force of fine magnetic CoPt dot enhanced by nanometer-sizing of the dot. The 39- to 106-nm-sized CoPt magnetic dot arrays were formed by30-keV-electron beam (EB) drawing with thin calixarene resist and 200-eV-Ar ion milling. Using the fine magnetic dot arrays, we measured coercive forces of the dot by x-ray magnetic circular dichroism (XMCD) with an energy of 11.56 keV, which corresponds to an energy edge of Pt-L3. It is experimentally demonstrated that a coercive force of the nanometer-sized magnetic column increased as the dot diameter decreased.
- リンク情報
- ID情報
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- DOI : 10.4028/www.scientific.net/KEM.534.122
- ISSN : 1013-9826
- Web of Science ID : WOS:000316642000023