2013年
Improved Observation Contrast of Block-Copolymer Nanodot Pattern Using Carbon Hard Mask (CHM)
ADVANCED MICRO-DEVICE ENGINEERING III
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- 巻
- 534
- 号
- 開始ページ
- 126
- 終了ページ
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- 記述言語
- 英語
- 掲載種別
- DOI
- 10.4028/www.scientific.net/KEM.534.126
- 出版者・発行元
- TRANS TECH PUBLICATIONS LTD
In this work, improvement of the observation contrast was investigated by using a carbon film as the hard mask for pattern transfer of block copolymer (BCP) nanodots. The PS-PDMS (Poly(styrene-b-dimethyl siloxane)) block copolymer was adopted here. The observation contrast was greatly improved after transferring block copolymer (BCP) nanodots pattern to the underlying Si substrate through the carbon hard mask compared that before nanodot pattern transfer. Pattern transfer was also demonstrated to be very effective using carbon hard mask.
- リンク情報
- ID情報
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- DOI : 10.4028/www.scientific.net/KEM.534.126
- ISSN : 1013-9826
- Web of Science ID : WOS:000316642000024