論文

査読有り
2018年8月6日

Comparison of image properties in full-field phase X-ray microscopes based on grating interferometry and Zernike's phase contrast optics

APPLIED PHYSICS LETTERS
  • Takano Hidekazu
    • ,
  • Wu Yanlin
    • ,
  • Irwin Jeff
    • ,
  • Maderych Stan
    • ,
  • Leibowitz Marty
    • ,
  • Tkachuk Andrei
    • ,
  • Kumar Arjun
    • ,
  • Hornberger Benjamin
    • ,
  • Momose Atsushi
巻
113
号
6
DOI
10.1063/1.5039676
リンク情報
DOI
https://doi.org/10.1063/1.5039676
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000441333900040&DestApp=WOS_CPL
ID情報
  • DOI : 10.1063/1.5039676
  • ISSN : 0003-6951
  • Web of Science ID : WOS:000441333900040
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