論文

査読有り
2017年2月1日

Test Environment-Dependent Discrete Binomial-Type Software Reliability Models

International Journal of Reliability, Quality and Safety Engineering
  • Shinji Inoue
  • ,
  • Shigeru Yamada

24
1
開始ページ
1750003-1
終了ページ
1750003-14
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1142/S0218539317500036
出版者・発行元
World Scientific Publishing Co. Pte Ltd

We have no doubt that the software reliability growth process in the testing phase depends on the test environment factors, such as the attained testing coverage, the number of test-runs and the debugging skills, which affect the software failure occurrence or fault detection phenomenon in the testing phase. In this paper, we propose software reliability models that consider the effects of the testing environment factors. Our models are developed by a program size-dependent discrete binomial-type software reliability modeling approach. This modeling approach is also consistent with software reliability data collection and enables us to consider the effect of the program size. Finally, we compare the accuracy of our models in terms of mean square errors (MSE) and Akaike's information criterion (AIC) with the existing corresponding model by using actual data.

リンク情報
DOI
https://doi.org/10.1142/S0218539317500036
ID情報
  • DOI : 10.1142/S0218539317500036
  • ISSN : 0218-5393
  • SCOPUS ID : 84994753567

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