論文

2012年10月15日

Electron--Vibron Interaction Effects on Scanning Tunneling Microscopy Current through Melamine Adsorbed on Cu(100)

J Phys Soc Jpn
  • SARHAN Abdulla
  • ,
  • SAKAUE Mamoru
  • ,
  • NAKANISHI Hiroshi
  • ,
  • Kasai Hideaki

81
10
開始ページ
104711
終了ページ
104711-7
記述言語
英語
掲載種別
DOI
10.1143/JPSJ.81.104711
出版者・発行元
The Physical Society of Japan

Electron transport through the melamine molecule was studied. Melamine molecules adsorbed on a Cu(100) surface were investigated by density functional theory (DFT) calculations with the dynamical matrix method. On the basis of calculation results, a model Hamiltonian for a system composed of scanning tunneling microscope (STM), a melamine molecule, and a Cu surface was proposed, taking into account electron--vibron (electron--molecular vibrations) interactions within the melamine molecule. Then, the electronic current was formulated by the nonequilibrium Green's function (NEGF) method. Results show that current is affected by the electron--vibron interactions defined in the melamine molecule through its controllable structural changes. The rectification and fluctuation of current are triggered by low-energy electron--vibron interactions. Furthermore, the electron--vibron interaction effect is found to be enhanced as temperature increases to where higher-energy vibrons begin to be excited at lower energies. However, current becomes uniform at higher temperatures, which shows an undesired sensitivity. The weakening of the electron--vibron interaction of the out-of-molecular-plane vibrational motion can transfer the melamine molecule in its tautomerization state into a current rectifier. The reduction or induction of the repulsion of lone pairs of consecutive N atoms causes the induction or reduction of the low-energy in-plane vibrational motion, which in turn causes the switching of the I--V characteristics between less stable melamine tautomers.

リンク情報
DOI
https://doi.org/10.1143/JPSJ.81.104711
CiNii Articles
http://ci.nii.ac.jp/naid/40019447558
CiNii Books
http://ci.nii.ac.jp/ncid/AA00704814
URL
http://id.ndl.go.jp/bib/024011957
ID情報
  • DOI : 10.1143/JPSJ.81.104711
  • ISSN : 0031-9015
  • CiNii Articles ID : 40019447558
  • CiNii Books ID : AA00704814

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