MISC

査読有り
2012年

Laser-induced transient stress distribution inside a single crystal by time-resolved birefringence imaging

Proceedings of SPIE - The International Society for Optical Engineering
  • Takaya Tochio
  • ,
  • Masaaki Sakakura
  • ,
  • Shingo Kanehira
  • ,
  • Yasuhiko Shimotsuma
  • ,
  • Kiyotaka Miura
  • ,
  • Kazuyuki Hirao

8243
記述言語
英語
掲載種別
DOI
10.1117/12.908186

When femtosecond laser pulses are focused inside a single crystal, anisotropic structural changes such as dislocation and cleavage occur along specific orientations. It can be interpreted that the anisotropic structural changes should be induced by transient stress after photoexcitation, such as a thermal stress and stress wave. To elucidate the mechanism of the laser induced structural changes inside crystals, we developed a novel time-resolved polarization imaging system, in which circularly polarized laser pulse was used as a probe light. The system enabled us to observe laser-induced transient stress distribution as well as the orientation after focusing fs laser pulses inside MgO and LiF single crystals. Based on the observation, we elucidated the relation between laser-induced transient stress distribution and anisotropic structural change inside the crystals. © 2012 SPIE.

リンク情報
DOI
https://doi.org/10.1117/12.908186
ID情報
  • DOI : 10.1117/12.908186
  • ISSN : 0277-786X
  • SCOPUS ID : 84859593292

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