WEN Xiaoqing

J-GLOBAL         Last updated: Dec 13, 2018 at 03:02
 
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Name
WEN Xiaoqing
URL
http://aries3a.cse.kyutech.ac.jp/~wen/
Affiliation
Kyushu Institute of Technology
Section
Faculty of Computer Science and Systems Engineering, Department of Creative Informatics
Job title
Professor
Degree
Doctor of Engineering(Osaka University), Master(Hiroshima University), Bachelor of Engineering(Tsinghua University)
Other affiliation
Kyushu Institute of TechnologyKyushu Institute of Technology

Research Areas

 
 

Academic & Professional Experience

 
2016
   
 
 Asscociate Member,Embedded System Research Laboratory,Universiti Teknologi Malaysia (UTM)
 
1998
 - 
2003
 Vice President (VP) and Chief Technoilogy Officer (CTO),SynTest Techniologies, Inc.
 
1995
 - 
1996
 Visiting Researcher,Department of Eletrical and Computer Engineering University of Wisconsin - Madison
 
1993
 - 
1997
 Lecturer,Department of Information Engineering Akita University
 
2004
 - 
2007
 Associate Professor,Graduate School of Computer Science and Systems Engineering,Kyushu Institute of Technology
 

Education

 
 
 - 
1990
Information Engineering, Graduate School, Division of Engineering, Hiroshima University
 
 
 - 
1993
Applied Physics, Graduate School, Division of Engineering, Osaka University
 
 
 - 
1986
Computer Science and Technology, Tsinghua University
 

Committee Memberships

 
2011
   
 
 Technical Activity Committee on Power-Aware Testing, TTTC, IEEE Computer Society
 
2007
   
 
 Asian Subcommittee, IEEE International Test Conference
 
2010
   
 
Institute of Electrical and Electronics Engineers (IEEE)  Co-Chair (CS-TTTC Technical Activity Committee on Power-Aware Testing)
 
2011
 - 
2013
Institute of Electrical and Electronics Engineers (IEEE)  IEEE CS Fellows Evaluation Committee Member (2012-2013)
 
2013
 - 
2014
IEEE Transactions on Computer-Aided Design  Advisory Committee Member (2014)
 

Awards & Honors

 
2007
Best Paper Award
 
2012
IEEE Fellow
 
2016
Best Paper Award
 
2018
Best Paper Award
 

Misc

 
L.-T. Wang,X. Wen,H. Furukawa,F. Hsu,S. Lin,S. Tsai,K. S. Abdel-Hafez,S. Wu
IEEE International Test Conference   916-925   2004
X. Wen,T. Miyoshi,S. Kajiihara,L. Wang,K. K. Saluja,and K. Kinoshita
IEEE/ACM International Conference on Computer Aided Design   633-640   2004
On Extraction of a Cube with the Minimum Number of Literals from a Given Input Vector
K. Miyase,S. Nagayama,S. Kajihara,X. Wen,and S. M. Reddy
IEEE Workshop on RTL and High Level Testing   71-76   2004
Y. Doi,S. Kajihara,X. Wen,L. Li,and K. Chakrabarty
ACM Asian and South Pacific Design Automation Conference   59-64   2005
X. Wen,H. Tamamoto,K. K. Saluja,K. Kinoshita
Journal of Computer Science and Technology   20(2) 187-194   2005

Books etc

 
VLSI Test Principles and Architectures: Design for Testability
Morgan Kaufmann Publishers   2006   ISBN:978-0123705976
Chapter 2: "Design for Testability" in VLSI Test Principles and Architectures: Design for Testability
Morgan Kaufmann Publishers   2006   ISBN:978-0123705976
Chapter 7: "Low-Power Testing" in Advanced SOC Test Architectures Towards Nanometer Designs
Morgan Kaufmann Publishers   2007   ISBN:978-0123739735
Chapter 7: "Test Synthesis" in Electronic Design Automation: Synthesis, Verification, and Test
Morgan Kaufmann Publishers   2009   ISBN:978-0123743640
Chapter 3: "Low-Power Test Generation" in Power-Aware Testing and Test Strategies for Low Power Devices
Springer   2009   ISBN:978-1441909275

Conference Activities & Talks

 
Low-Capture-Power Test Generation for Scan Testing
COE workshop for SoC Design Technology and Automation   2005   

Works

 
Power-Aware Testing and Test Strategies for Low Power Devices
2009
Power-Aware Testing and Test Strategies for Low Power Devices
2012
Power-Aware Testing in the Era of IoT
2017
Power-Aware Testing in the Era of IoT
2018
Power-Aware Testing in the Era of IoT
2018

Research Grants & Projects

 
Low-Power LSI Test
Project Year: 2004   
LSI High Reliability Design
Cooperative Research
Project Year: 2014   
LSI Test Generation
Project Year: 1993   
LSI Design for Testability
Project Year: 1993   
LSI Fault Diagnosis
Project Year: 1993   

Patents

 
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
20020120896
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
20020138801
Multiple-capture DFT system for scan-based integrated circuits
20020184560
Computer-aided design system to automate scan synthesis at register-transfer level
20030023941
Method and system to optimize test cost and disable defects for scan and BIST memories
20020194558