玄燦慶 (Chankyeong Hyon) - マイポータル

基本情報

An automated glitch-detection/restoration method of atomic force microscope images

C Hyon, S Oh, H Kim, S Sull, S Hwang, D Ahn, Y Park, E Kim

REVIEW OF SCIENTIFIC INSTRUMENTS 73(9) 3245-3250 2002年9月
Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs

HYON C K, CHOI S C, SONG S‐H, HWANG S W, SON M H, AHN D, PARK Y J, KIM E K

Appl. Phys. Lett 77(16) 2607-2609 2000年
Direct nanometer-scale patterning by the cantilever oscillation of an atomic force microscope

HYON C K, CHOI S C, HWANG S W, AHN D, KIM Y, KIM E K

Appl. Phys. Lett. 75(2) 292-294 1999年