小木曽久人 (Hisato Ogiso) - マイポータル

基本情報

所属: 独立行政法人産業技術総合研究所先進製造プロセス研究部門集積加工研究グループ

J-GLOBAL ID: 200901038163840168
researchmap会員ID: 5000086631

外部リンク: http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=H23877895

MISC

Scanning capacitance microscopy evaluation of lead zirconate titanate film formed by aerosol deposition method

Y Naitou, H Ogiso

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 45(3B) 1922-1925 2006年3月
Indentation method to measure the residual stress induced by ion implantation

Q Wang, K Ozaki, H Ishikawa, S Nakano, H Ogiso

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 242(1-2) 88-92 2006年1月
Indentation method to measure the residual stress induced by ion implantation�

WANG Q, OZAKI K, ISHIKAWA H, NAKANO S, OGISO H

Nuclear Instruments and Method B 242(1-2) 88-92 2006年
Elastic nano-structure of diamond-like carbon (DLC)

H Ogiso, M Yoshida, S Nakano, H Yasui, K Awazu

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 242(1-2) 311-314 2006年1月
Spatial fluctuation of dielectric properties in Hf-based high-k gate films studied by scanning capacitance microscopy

Y Naitou, A Ando, H Ogiso, S Kamiyama, Y Nara, K Nakamura, H Watanabe, K Yasutake

APPLIED PHYSICS LETTERS 87(25) 252908-1-252908-3 2005年12月
Compression test system for a single submicrometer particle

M Yoshida, H Ogiso, S Nakano, J Akedo

REVIEW OF SCIENTIFIC INSTRUMENTS 76(9) 093905- 2005年9月
Significant stiffness reduction at ferroelectric domain boundary evaluated by ultrasonic atomic force microscopy

T Tsuji, S Saito, K Fukuda, K Yamanaka, H Ogiso, J Akedo, Y Kawakami

APPLIED PHYSICS LETTERS 87(7) 071909-071909 2005年8月
Fabrication of 3-D microstructures with a catalytic surface composed of an ion-implanted layer

S Nakano, H Ogiso

SURFACE & COATINGS TECHNOLOGY 196(1-3) 364-368 2005年6月
Effects of X-ray irradiation on optical property and defect relaxation in MeV ion-implanted MgO

H Ogiso, S Nakano

SURFACE & COATINGS TECHNOLOGY 196(1-3) 15-18 2005年6月
マイクロスケール微粒子の圧縮破壊強度評価

2005年度年次大会講演論文集 7 157-158 2005年
イオン注入処理されたステンレス鋼の疲労特性に関する研究/ Fatigue Property of Stainless Steel by Ion Implantation

Transactions of the Materials Research Society of Japan 30(3) 801-804 2005年
Nanoparticle fabrication for micro total analysis system by using ion implantation and surface etching

S Nakano, M Ishizuka, Q Wang, H Ogiso

SURFACE & COATINGS TECHNOLOGY 187(2-3) 167-171 2004年10月
Curvature-based residual stress measurement for ion-implanted stainless-steel sheet

Q Wang, H Ishikawa, S Nakano, H Ogiso, J Akedo

VACUUM 75(3) 225-229 2004年7月
Effects of substrate temperature during implantation on the mechanical properties of ion-implanted silicon

Q Wang, H Ishikawa, H Ogiso, S Nakano, J Akedo

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 217(4) 598-602 2004年6月
Evaluation of domain boundary of piezo/ferroelectric material by ultrasonic atomic force microscopy

T Tsuji, H Ogiso, J Akedo, S Saito, K Fukuda, K Yamanaka

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 43(5B) 2907-2913 2004年5月
低エネルギーion中による触媒用微粒子材料の形成

21世紀連合シンポジウム抄録集 57-58 2004年
Compensation of cross talk in the optical lever deflection method used in atomic force microscopy

S Fujisawa, H Ogiso

REVIEW OF SCIENTIFIC INSTRUMENTS 74(12) 5115-5117 2003年12月
Martensitic transformation and the stress induced by 3 MeV ion implantation in an austenite stainless steel sheet

Q Wang, H Ogiso, S Nakano, J Akedo, H Ishikawa

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 206(C) 118-122 2003年5月
Finite element method analysis of evaluation of surface micro cracks using laser ultrasound generated by phase velocity scanning method

H Sato, H Ogiso, K Yamanaka

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 42(5B) 3184-3188 2003年5月
Abnormal distribution of defects introduced into MgO single crystals by MeV ion implantation

H Ogiso, S Nakano, J Akedo

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 206 157-161 2003年5月

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