MISC

1994年6月

ORIENTATION OF MGO THIN-FILMS ON SI(100) AND GAAS(100) PREPARED BY ELECTRON-BEAM EVAPORATION

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
  • A MASUDA
  • ,
  • K NASHIMOTO

33
6A
開始ページ
L793
終了ページ
L796
記述言語
英語
掲載種別
DOI
10.1143/jjap.33.L793
出版者・発行元
JAPAN J APPLIED PHYSICS

MgO thin films were prepared on Si(100) and GaAs(100) by electron-beam evaporation. MgO thin films with (100) orientation were obtained at 610-degrees-C with the deposition rate of 0.5 angstrom/s, and those with (111) orientation were obtained below 440-degrees-C with deposition rate higher than 8 angstrom/s, on Si substrates. (100) oriented MgO thin films, however. grew on Si at 440-degrees-C upon decreasing the deposition rate to 0.3 angstrom/s. MgO thin films with (100) orientation having cube-on-cube epitaxy were obtained on GaAs substrates at the temperature as low as 280-degrees-C even at the deposition rate of 1.4 angstrom/s.

リンク情報
DOI
https://doi.org/10.1143/jjap.33.L793
CiNii Articles
http://ci.nii.ac.jp/naid/110003921872
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:A1994NQ76600010&DestApp=WOS_CPL
ID情報
  • DOI : 10.1143/jjap.33.L793
  • ISSN : 0021-4922
  • CiNii Articles ID : 110003921872
  • Web of Science ID : WOS:A1994NQ76600010

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