MISC

1998年6月15日

Fabrication of Pb(Zr,Ti)O<inf>3</inf>/MgO/GaN/GaAs structure for optoelectronic device applications

Journal of Crystal Growth
  • Atsushi Masuda
  • ,
  • Shinya Morita
  • ,
  • Hideki Shigeno
  • ,
  • Akiharu Morimoto
  • ,
  • Tatsuo Shimizu
  • ,
  • Jun Wu
  • ,
  • Hiroyuki Yaguchi
  • ,
  • Kentaro Onabe

189-190
開始ページ
227
終了ページ
230
DOI
10.1016/S0022-0248(98)00241-3

Pb(Zr,Ti)O3 (PZT) films were deposited on cubic GaN/(1 0 0)GaAs for the first time with or without MgO buffer layer by pulsed laser ablation. MgO films were grown on cubic GaN with cube-on-cube epitaxy. It was found that MgO buffer layer is very useful for suppressing the diffusion of O and metal elements into GaN layer. Preferentially [1 0 0]-oriented perovskite PZT films were obtained on cubic GaN with MgO buffer layer although randomly oriented perovskite PZT films were obtained without MgO buffer layer. PZT/MgO/GaN structure is one of the promising candidates for integrated devices composed of ferroelectric waveguides and blue laser diodes. © 1998 Elsevier Science B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/S0022-0248(98)00241-3
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0032092953&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=0032092953&origin=inward
ID情報
  • DOI : 10.1016/S0022-0248(98)00241-3
  • ISSN : 0022-0248
  • SCOPUS ID : 0032092953

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