1998年6月15日
Fabrication of Pb(Zr,Ti)O<inf>3</inf>/MgO/GaN/GaAs structure for optoelectronic device applications
Journal of Crystal Growth
- ,
- ,
- ,
- ,
- ,
- ,
- ,
- 巻
- 189-190
- 号
- 開始ページ
- 227
- 終了ページ
- 230
- DOI
- 10.1016/S0022-0248(98)00241-3
Pb(Zr,Ti)O3 (PZT) films were deposited on cubic GaN/(1 0 0)GaAs for the first time with or without MgO buffer layer by pulsed laser ablation. MgO films were grown on cubic GaN with cube-on-cube epitaxy. It was found that MgO buffer layer is very useful for suppressing the diffusion of O and metal elements into GaN layer. Preferentially [1 0 0]-oriented perovskite PZT films were obtained on cubic GaN with MgO buffer layer although randomly oriented perovskite PZT films were obtained without MgO buffer layer. PZT/MgO/GaN structure is one of the promising candidates for integrated devices composed of ferroelectric waveguides and blue laser diodes. © 1998 Elsevier Science B.V. All rights reserved.
- リンク情報
- ID情報
-
- DOI : 10.1016/S0022-0248(98)00241-3
- ISSN : 0022-0248
- SCOPUS ID : 0032092953