論文

査読有り
2016年

Proposed new damp heat test standards for commercial CIGS modules with bias application or light irradiation

Proceedings of SPIE - The International Society for Optical Engineering
  • Keiichiro Sakurai
  • ,
  • Hiroshi Tomita
  • ,
  • Kinichi Ogawa
  • ,
  • Darshan Schmitz
  • ,
  • Hajime Shibata
  • ,
  • Shuuji Tokuda
  • ,
  • Atsushi Masuda

9938
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1117/12.2237431
出版者・発行元
SPIE

Based on our results that conventional damp-heat (DDH) test on a commercial CCIGS (a.k.a. CCIS, CIGSS) module causes an irreversible Test-specific degradation (TSD) that is not observed in modules deployed in fields, we propose a new option for DDH testing of CIGS modules. We have tested full-size CIGS modules with/without forward bias, light irradiation and humidity during heat tests. The results clearly show that adding forward bias, or white light irradiation during DH tests suppresses this irreversible degradation. Based on these results, we have proposed to add forward bias and/or light irradiation during DH tests of CIGS modules, to make the test condition closer to real fields and suppress degradations not observed in the field.

リンク情報
DOI
https://doi.org/10.1117/12.2237431
ID情報
  • DOI : 10.1117/12.2237431
  • ISSN : 1996-756X
  • ISSN : 0277-786X
  • SCOPUS ID : 85006251378

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